Results for ATOMIC-FORCE MICROSCOPE

Publications & Outputs

1. A dynamic model of the jump-to phenomenon during AFM analysis

   Bowen, J. & Cheneler, D., 18/12/2012, In: Langmuir. 28, 50, p. 17273-17286 14 p.

   Research output: Contribution to Journal/Magazine › Journal article › peer-review

2. Nanoscale spatial resolution probes for scanning thermal microscopy of solid state materials

   Tovee, P., Pumarol Crestar, M., Zeze, D., Kjoller, K. & Kolosov, O., 7/12/2012, In: Journal of Applied Physics. 112, 11, 11 p., 114317.

   Research output: Contribution to Journal/Magazine › Journal article › peer-review