Chan, A., Winter, S., Saissi, H., Pattabiraman, K. & Suri, N., 13/03/2017, 2017 IEEE International Conference on Software Testing, Verification and Validation (ICST).IEEE, p. 184-19512 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review