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Publications & Outputs

  1. Frequency domain estimation of integrated volatility for Ito processes in the presence of market-microstructure noise

    Olhede, S. C., Sykulski, A. M. & Pavliotis, G. A., 2009, In: Multiscale Modeling and Simulation. 8, 2, p. 393-427 35 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review