Results for Gallium arsenide; Indium phosphide; Molecular beam epitaxy (MBE); X-Ray diffraction

Publications & Outputs

1. Characterization of linearly graded metamorphic InGaP buffer layers on GaAs using high-resolution X-ray diffraction

   Yuan, K., Radhakrishnan, K., Zheng, H. Q., Zhuang, Q. & Ing, G. I., 2001, In: Thin Solid Films. 391, 1, p. 36-41 6 p.

   Research output: Contribution to Journal/Magazine › Journal article