Chan, A., Winter, S., Saissi, H., Pattabiraman, K. &
Suri, N.,
13/03/2017,
2017 IEEE International Conference on Software Testing, Verification and Validation (ICST). IEEE,
p. 184-195 12 p.Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review