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Publications & Outputs

  1. Walking under the ladder logic: PLC-VBS: a PLC control logic vulnerability scanning tool

    Maesschalck, S., Staves, A., Derbyshire, R., Green, B. & Hutchison, D., 30/04/2023, In: Computers and Security. 127, 14 p., 103116.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  2. Performance evaluation of smart metering infrastructure using simulation tool

    Panchadcharam, S., Taylor, G. A., Ni, Q., Pisica, I. & Fateri, S., 2012, Universities Power Engineering Conference (UPEC), 2012 47th International. London: IEEE, p. 1-6 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  3. A hopping code for MMFSK in a power-line channel

    Adebisi, B., Ali, S. & Honary, B., 07/2009, In: Journal of Communications. 4, 6, p. 429-436 8 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  4. Multi-Emitting/Multi-Receiving Points MMFSK for Power-line Communications

    Adebisi, B., Ali, S. & Honary, B., 03/2009, Power Line Communications and Its Applications, 2009. ISPLC 2009. IEEE International Symposium on. Dresden, Germany: IEEE, p. 239-243 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  5. Uniformly distributed hopping pattern for MMFSK in power line communications

    Adebisi, B., Ali, S. & Honary, B., 04/2008, IEEE ISPLC (International Symposium on Power-Line Communications and Its Applications) . Jeju Island, Korea: IEEE, p. 244–248 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  6. Wire integrity testing using intermodulation product processing

    Adebisi, B., Sutherland, A. & Honary, B., 04/2008, IEEE ISPLC (International Symposium on Power-Line Communications and Its Applications) . Jeju Island, Korea: IEEE, p. 213-217 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review