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Results for Scanning probe microscopy

Publications & Outputs

  1. Direct nanoscale mapping of open circuit voltages at local back surface fields for PERC solar cells

    Longacre, A., Martin, M., Moran, T., Kolosov, O., Schneller, E., Curran, A. J., Wang, M., Dai, J., Bruckman, L. S., Jaubert, J-N., Davis, K. O., Braid, J. L., French, R. H. & Huey, B., 1/09/2020, In : Journal of Materials Science. 55, 25, p. 11501-11511 11 p.

    Research output: Contribution to journalJournal article

  2. Geometrically Enhanced Thermoelectric Effects in Graphene Nanoconstrictions

    Harzgeim, A., Spiece, J., Evangeli, C., McCann, E., Falko, V., Sheng, Y., Warner, J. H., Briggs, G. A. D., Mol, J. A., Gehring, P. & Kolosov, O. V., 2018, In : Nano Letters. 18, 12, p. 7719-7725 7 p.

    Research output: Contribution to journalLetter

  3. Selecting suitable image dimensions for scanning probe microscopy

    Bowen, J. & Cheneler, D., 12/2017, In : Surfaces and Interfaces. 9, p. 133-142 10 p.

    Research output: Contribution to journalJournal article

  4. Multicomponent self-assembly with a shape-persistent n-heterotriangulene macrocycle on au(111)

    Cui, K., Schlütter, F., Ivasenko, O., Kivala, M., Schwab, M. G., Lee, S-L., Mertens, S. F. L., Tahara, K., Tobe, Y., Müllen, K., Mali, K. S. & De Feyter, S., 2015, In : Chemistry - A European Journal. 21, 4, p. 1652-1659 8 p.

    Research output: Contribution to journalJournal article

  5. Oxygen reduction on structurally well defined, bimetallic PtRu surfaces: monolayer PtxRu1-x/Ru(0001) surface alloys versus Pt film covered Ru(0001)

    Brimaud, S., Engstfeld, A. K., Alves, O. B., Hoster, H. E. & Behm, R. J., 02/2014, In : Topics in Catalysis. 57, 1-4, p. 222-235 14 p.

    Research output: Contribution to journalJournal article

  6. Ultrasonic force microscopy for nanomechanical characterization of early and late-stage amyloid-β peptide aggregation

    Tinker-Mill, C., Mayes, J., Allsop, D. & Kolosov, O., 2014, In : Scientific Reports. 4, 7 p., 4004.

    Research output: Contribution to journalJournal article

  7. High-accuracy analysis of nanoscale semiconductor layers using beam-exit Ar-ion polishing and scanning probe microscopy

    Robson, A., Grishin, I., Young, R., Sanchez, A. M., Kolosov, O. & Hayne, M., 2013, In : ACS Applied Materials and Interfaces. 5, 8, p. 3241-3245 5 p.

    Research output: Contribution to journalJournal article

  8. Surface morphology and crystallinity of biaxially stretched PET films on the nanoscale

    Dinelli, F., Assender, H. E., Kirov, K. & Kolosov, O., 05/2000, In : Polymer. 41, 11, p. 4285-4289 5 p.

    Research output: Contribution to journalJournal article