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Results for design-for-test

Publications & Outputs

  1. Mixed-signal custom IC control processors incorporating design for test/self-test.

    Grout, I., Burge, S. E. & Winsby, A. J., 09/1998, IEE Colloquium on DSP Chips in Real Time Measurement and Control (Digest No: 1997/301). Leicester: IEEE, p. 1/1-1/4

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

  2. Design-for-test (DfT) study on a current mode DAC

    Olbrich, T., Mozuelos, R., Richardson, A. & Bracho, S., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 374-379 6 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  3. Mixed signal test - Techniques, applications and demands

    Baker, K., Richardson, A. M. & Dorey, A. P., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 358-365 8 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review