Home > Research > Browse

Results for fault simulation

Publications & Outputs

  1. Fault simulation for MEMS

    Rosing, R., Richardson, A., Dorey, A. & Peyton, A., 1/06/1999, Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on. p. 7/1 -7/6

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  2. Mixed signal test - Techniques, applications and demands

    Baker, K., Richardson, A. M. & Dorey, A. P., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 358-365 8 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review