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Results for phase locked loop - BIST - DfT - test - jitter

Publications & Outputs

  1. Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs.

    Burbidge, M. J., Poullet, F., Tijou, J. & Richardson, A. M. D., 08/2003, In: Journal of Electronic Testing. 19, 4, p. 481-490 10 p.

    Research output: Contribution to Journal/MagazineJournal article