Andrew Richardson - Publications & Outputs - Research Portal

Professor Andrew Richardson

Professor

1 - 100 out of 132Page size: 100

10
25
50
100
500

RSS feed of this list

Sort by: Type

Chapter (peer-reviewed)
Published
Test of A/D Converters
Richardson, A. & Lechner, A., 2008, Test & Diagnostics of Analogue, Mixed Signal & RF Integrated Circuits. Sun, Y. (ed.). Stevenage: IET Press, p. 213-234 22 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter (peer-reviewed)
Published
Phase Locked Loop Test Methodology
Richardson, A. & Burbidge, M., 2008, Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits. Sun, Y. (ed.). Stevenage: IET Press, p. 277-306 30 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter (peer-reviewed)
Chapter
Published
An on-line monitoring technique for electrode degradation in bio-fluidic microsystems.
Al-Gayem, Q., Liu, H., Richardson, A. M. D., Burd, N. & Kumar, M., 10/2010, Proceedings of the 2010 IEEE International Test Conference (ITC). Austin, Texas: IEEE, p. 1-10 10 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Acoustic system for online wiring test on aircraft.
Xu, Z., Koltsov, D., Richardson, A. & Sutherland, A., 18/06/2008, IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008.. IEEE, p. 1-4 4 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Bit-stream manipulation for SD modulator failure mode analysis.
Burbidge, M., Georgopoulos, K., Lechner, A. & Richardson, A., 2006, Proceedings of the 11th IEEE European test symposium..
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Modelling the behaviour of soldier joints for wafer level SIP.
Liu, H., Strusevich, N., Stoyanov, S., Bailey, C., Richardson, A. M. D., Dumas, N., Yannou, J. M. & Georgel, V., 2006, Proceedings of the 8th IEEE electronics packaging technology conference..
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Behavioural error injection, spectral analysis and error detection for a 4th order single-loop sigma-delta converter using Walsh transforms.
Georgopoulos, K., Burbidge, M., Lechner, A. & Richardson, A. M. D., 2005, Proceedings of the ETS workshop on Testing of High Resolution Mixed Signal Interfaces.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Investigation into the Use of Alternative Transformation Techniques for High-Resolution A/D Converter Testing.
Georgopoulos, K., Burbidge, M., Lechner, A. & Richardson, A. M. D., 2005, Proceedings of the IEEE Mixed Signal Test Workshop.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Design Considerations for On-line Testing of a Capacitive Accelerometer.
Jeffery, C., Bunyan, R. J. T., Combes, D., King, D. O. & Richardson, A. M. D., 2005, Proceedings of the 11th IEEE International Mixed-Signals Testing Workshop. p. 220-223 4 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
The integration of on-line monitoring and reconfiguration functions using IEEE1149.4 into a safety critical automotive electronic control unit.
Jeffery, C., Cutajar, R., Richardson, A. M. D., Prosser, S., Lickess, M. & Riches, S., 2005, Proceedings of Design, Automation and Test in Europe, 2005.. Vol. 3. p. 153-158 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops.
Burbidge, M., Lechner, A., Bell, G. & Richardson, A. M. D., 2004, IEE proceedings - circuits, devices and systems. 4 ed. Vol. 151. p. 337-348 12 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Techniques for automatic on chip closed loop transfer function monitoring for embedded charge pump phase locked loops.
Burbidge, M. J., Tijou, J. & Richardson, A. M. D., 19/12/2003, Design, Automation and Test in Europe Conference and Exhibition, 2003. p. 496-501 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Construction of nonlinear dynamic MEMS component models using cosserat theory.
Wang, C., Richardson, A. M. D., Liu, D., Rosing, R., Tucker, R. & De Masi, B., 05/2003, Proceedings of the SPIE design, test, integration and packaging of MEMS symposium. France: Cannes Mandelieu
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Investigations into testability improvements on a 16 bit audio sigma-delta ADC through the use of on-chip techniques.
De Venuto, D., Compagne, E. & Richardson, A. M. D., 2003, Proceedings of IMSTW 2003.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Online monitoring for automotive sub-systems using 1149.4.
Jeffrey, C., Lechner, A. & Richardson, A. M. D., 2003, EPRINTS-BOOK-TITLE. 1.3 ed.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Re-using IEEE1149.4 as an infrastructure for online monitoring.
Jeffrey, C., Lechner, A. & Richardson, A. M. D., 2003, Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03). p. 247-249 3 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Modelling techniques for reliability prediction in MEMS technologies.
Rosing, R. & Richardson, A. M. D., 2003, Proceedings of the Nanotech 2003 conference.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs.
Burbidge, M. J., Tijou, J., Poullet, F. & Richardson, A. M. D., 2002, Proceedings of the Seventh IEEE European Test Workshop, 2002.. IEEE, p. 95-102 8 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.
Burbidge, M., Richardson, A. M. D. & Lechner, A., 2001, Proceedings of the 7th IEEE international test workshop. p. 97-102 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs.
Lechner, A., Burbidge, M. J., Richardson, A. M. D. & Hermes, B., 2001, Proceedings of the 2nd Latin-American test workshop (LATW ’01). p. 194-199 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
A failure mode analysis of a 6-bit folding ADCs.
Lechner, A., Richardson, A. M. D., Burbidge, M. & Hermes, B., 2001, Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01). p. 19-23 5 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Short circuit faults in state-of-the-art ADCs – are they hard or soft?
Lechner, A., Richardson, A. M. D. & Hermes, B., 2001, 10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan. IEEE Computer Society, p. 417-422 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Towards a better understanding of failure modes and test requirements of ADCs.
Lechner, A., Richardson, A. M. D. & Hermes, B., 2001, Proceedings of a conference: automation and test in Europe (DATE ’01). p. 803
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Finite element analysis to support component level fault modelling for MEMS.
Reichenbach, R., Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2001, Proceedings of SPIE design, test, integration and packaging of MEMS symposium. Vol. 4408. p. 147-158 12 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Generation of component level fault models for MEMS.
Rosing, R., Reichenbach, R., Richardson, A. M. D. & Dorey, A. P., 2001, Proceedings of the 7th international mixed-signal testing workshop (IMSTW ’01). p. 40-45 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Applications of mixed signal test strategies to next generation microsystems.
Jeffery, C., Rosing, R. & Richardson, A. M. D., 2000, Design, modeling, and simulation in microelectronics. 4228 ed. SPIE (Society of Photo-Optical Instrumentation Engineers), p. 21-32 12 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
A built-in test solution for a SMART silicon micromachined resonant pressure sensor.
Jeffery, C., Rosing, R. & Richardson, A. M. D., 2000, IEEE European Test Workshop. IEEE
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Design-for-testability for mixed signal and analogue design.
Richardson, A. M. D. & Lechner, A., 2000, Proceedings of 7th international conference on mixed design of integrated circuits and systems. Poland
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
A fault simulation methodology for MEMS.
Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2000, Proceedings of the design automation and test in Europe conference. Paris: IEEE, p. 476-483 8 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
A fault simulation methodology for MEMS.
Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2000, Proceedings of the IEE symposium on quality and automation (RESQUA 2000). Penang, Malaysia
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
A design for testability study on a high performance automatic gain control circuit.
Lechner, A., Richardson, A. M. D., Hermes, B. & Ohletz, M., 1998, Proceedings of the 16th IEEE VLSI test symposium. IEEE, p. 376-385 10 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Design for testability strategies for a high performance gain control circuit.
Lechner, A., Richardson, A. M. D., Hermes, B. & Perkins, A., 1998, Proceedings of the international IEEE mixed signal test workshop. The Hague
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
An approach to realistic fault prediction and layout design for testability in analogue circuits.
Prieto, J., Richardson, A. M. D., Rueda, A. & Grout, I., 1998, Proceedings of the conference on design, automation and test in Europe. Paris, p. 906-912 7 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Design for testability strategies for mixed signal and analogue designs: from layout to system.
Richardson, A. M. D., Lechner, A. & Olbrich, T., 1998, Proceedings of the 5th IEEE international conference on electronics, circuits and systems. Lisbon, p. 425-433 9 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
An integrated diagnostic reconfiguration (IDR) technique for fault tolerant mixed signal microsystems.
Sharif, E., Dorey, A. P. & Richardson, A. M. D., 1998, Proceedings of the IEEE international circuits and systems symposium. IEEE
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
A new methodology for IC product quality estimation.
Olbrich, T., Grout, I., Eben Aimine, Y., Richardson, A. & Contensou, J., 1997, Proceedings of the European design and test conference (ED&TC '97). Paris: IEEE Computer Society Press
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs.
Olbrich, T., Perez, J., Grout, I., Richardson, A. & Ferrer, C., 1996, Proceedings of the international test conference 1996. Washington DC, p. 511-520 10 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
A design-for-test structure for optimising analogue and mixed signal IC test
Bratt, A., Richardson, A. M. D., Harvey, R. & Dorey, A. P., 03/1995, European Design and Test Conference. IEEE, p. 24-33 10 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Development of class 1 QTAG monitor.
Bratt, A., Baker, K., Richardson, A. M. D. & Welbers, A., 1994, Proceedings of an international test conference: the next 25 years. IEEE Service Centre
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Analogue Fault Simulation Based on Layout-Dependent Fault Models.
Harvey, R., Richardson, A. M. D., Baker, K. & Bruls, E., 1994, Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years. Washington, DC, USA: IEEE Computer Society, p. 641-649 9 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
BIST and diagnostics for microsystems.
Olbrich, T., Bradley, D. A. & Richardson, A. M. D., 1994, Proceedings of the 7th ISATA conference: dedicated conferences on mechatronics and supercomputing applications in the transportation industries. Croydon: Automotive Automation, p. 575-580 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Self-test and diagnostics for smart sensors in automotive applications.
Olbrich, T., Bradley, D. A. & Richardson, A. M. D., 1994, Proceedings of the IEE colloquium on automotive sensors. p. 3/1-4
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
BIST and diagnostics for safety critical microsystems.
Olbrich, T., Richardson, A. M. D. & Bradley, D. A., 1994, Proceedings of an ESREF conference. Glasgow, p. 511-518 8 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Aspects of current reference generation and distribution for IDDx pass/fail current determination.
Bratt, A., Harvey, R. J. A., Dorey, A. P. & Richardson, A. M. D., 1993, Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Test evaluation for complex mixed signal ICs by introducing layout dependent faults.
Harvey, R. J. A., Richardson, A. M. D., Bruls, E. M. J. & Baker, K., 1993, Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London, p. 6/1-8
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Published
Reliability indicators.
Richardson, A. M. D. & Dorey, A. P., 1992, Third European symposium of reliability of electron devices, failure, physics and analysis (ESREF). Schabisch Gmund, p. 277-285 9 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter
Conference contribution/Paper
Published
Self-Monitoring, Self-Healing Biomorphic Sensor Technology
Richardson, A. & Cheneler, D., 3/10/2019, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019. Gizopoulos, D., Alexandrescu, D., Papavramidou, P. & Maniatakos, M. (eds.). IEEE, p. 121-124 4 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Scanning the strength of a test signal to monitor electrode degradation within bio-fluidic microsystems
Al-Gayem, Q., Liu, H., Khan, H. & Richardson, A., 2013, On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International. IEEE, p. 133-138 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Move from Online Test to Fault-tolerant: Design and Simulation of a Multi-Functional MEMS Sensor
Xu, Z., Richardson, A., Begbie, M. & Wang, C., 16/05/2011, Proceedings of the IEEE International Mixed Signals, Sensors and Systems Test Workshop. USA: IEEE COMPUTER SOC, p. 88-95 8 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
A multi-mode MEMS sensor design to support system test and health & usage monitoring applications
Xu, Z., Richardson, A., Koltsov, D., Li, L., Begbie, M. & Wang, C., 1/05/2010, Test Symposium (ETS), 2010 15th IEEE European. p. 263 1 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Integrated sensors for health monitoring in advanced electronic systems
Wang, C. H., Liu, Y., Desmulliez, M. & Richardson, A., 1/11/2009, Design and Test Workshop (IDT), 2009 4th International. IEEE, p. 1-6 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Built-in Test Solutions for the Electrode Structures in Bio-Fluidic Microsystems
Al-Gayem, Q., Liu, H., Richardson, A. & Burd, N., 2009, ETS 2009: EUROPEAN TEST SYMPOSIUM, PROCEEDINGS. LOS ALAMITOS: IEEE COMPUTER SOC, p. 73-78 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Health monitoring of aircraft wiring by acoustic method
Saha, S., Xu, Z., Koltsov, D., Richardson, A. & Sutherland, A., 2009, 2009 IEEE AEROSPACE CONFERENCE, VOLS 1-7. NEW YORK: IEEE, p. 3744-3753 10 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Delivering Bio-Mems & Microfluidic Education Around Accessible Technologies
Richardson, A., Liu, H., Koltsov, D., Rosing, R., Ryan, T. & Wooton, R., 28/05/2008, Proceedings of the 8th European Workshop on Microelectronics Education. EDA Publishing, 2 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
A novel method for test and calibration of capacitive accelerometers with a fully electrical setup
Dumas, N., Azaies, F., Mailly, F., Richardson, A. & Nouet, P., 2008, Design and Diagnostics of Electronic Circuits and Systems, 2008. DDECS 2008. 11th IEEE Workshop on . Straube, B., Drutarovsky, M., Renovell, M., Gramata, P. & Fischerova, M. (eds.). LOS ALAMITOS: IEEE COMPUTER SOC, p. 304-309 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Embedded Health Monitoring Strategies for Aircraft Wiring Systems
Xu, Z., Saha, S., Koltsov, D., Richardson, A., Honary, B., Hannu, J., Sutherland, A., Moffat, B. G. & Desmulliez, M. P. Y., 2008, ESTC 2008: 2ND ELECTRONICS SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS. NEW YORK: IEEE, p. 463-469 7 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Embedded Test & Health Monitoring Strategies for Bio-Fluidic Microystems
Liu, H., Richardson, A., Harvey, T. G., Ryan, T. & Pickering, C., 2008, ESTC 2008: 2ND ELECTRONICS SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS. NEW YORK: IEEE, p. 427-433 7 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Model based design optimization of micromechanical systems, based on the Cosserat theory
Wiegand, T., Peters, D., Laur, R., Rosing, R., Richardson, A., Del Sarto, M. & Baldo, L., 2008, PROCEEDINGS OF THE 11TH INTERNATIONAL CONFERENCE ON OPTIMIZATION OF ELECTRICAL AND ELECTRONIC EQUIPMENT, VOL I. Cernat, M. (ed.). NEW YORK: IEEE, p. 33-38 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Self-testing of micro-electrode array implemented as a bio-sensor
Liu, H., Dumas, N. & Richardson, A., 1/06/2007, 13th International mixed signals testing workshop and 3rd international GHz/Gbps test workshop. Póvoa de Varzim, Portugal: IEEE Portugal section, p. 166-170 5 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
A fault-tolerant MEF peptide synthesizer using control and direct sensing electrodes employing current and impedance tests
Zhang, X., Kerkhoff, H. G., Mailly, F., Nouet, P., Liu, H. & Richardson, A., 1/06/2007, 13th International mixed signals testing workshop and 3rd international GHz/Gbps test workshop, Póvoa de Varzim, Portugal. Portugal: University of Porto, p. 176-181 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Online sensor testing through superposition of encoded stimulus.
Dumas, N., Xu, Z., Georgopoulos, K., Bunyan, J. & Richardson, A., 04/2007, Proceedings of the Design, Test, Integration and Packaging of MEMS/MOEMS, Stresa, Lago Maggiore, Italy, 25-27 April 2007.. 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
A novel approach for online sensor testing based on an encoded test stimulus
Dumas, N., Xu, Z., Georgopoulos, K., Bunyan, R. J. T. & Richardson, A., 2007, ETS 2007: 12th IEEE European Test Symposium, Proceedings. LOS ALAMITOS: IEEE COMPUTER SOC, p. 105-110 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Built-in test of electrode degradation of multi-electrode array biosensors
Liu, H., Dumas, N., Richardson, A., Heal, R. & Kerkhoff, H. G., 1/06/2006, Proceedings of the 12th IEEE International mixed signal testing workshop (IMSTW'06), Edinburgh, United Kingdom. Lancaster, UK: ISLI en Lancaster University, p. 136-141 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Design for Micro and Nano Manufacture; The "PATENT-DfMM Network of Excellence: Modelling and Simulation Cluster
Richardson, A., Slattery, O. & Rencz, M., 1/04/2006, Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2006. EuroSime 2006. 7th International Conference on. p. 1 -5 5 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Design and Test of an Oscillation-based System Architecture for DNA Sensor Arrays
Liu, H., Kerkhoff, H. G., Richardson, A., Zhang, X., Nouet, P. & Azais, F., 1/06/2005, Proceedings of 11th International Mixed Signal Test Workshop, Cannes, France. France: TIMA Laboratory, p. 1-6 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
VHDL-AMS fault simulation for testing DNA bio-sensing arrays
Kerkhoff, H. G., Zhang, X., Liu, H., Richardson, A., Nouet, P. & Azais, F., 2005, 2005 IEEE SENSORS. NEW YORK: IEEE, p. 1030-1033 4 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Bias superposition: an on-line test strategy for a MEMS based conductivity sensor
Jeffrey, C., Xu, Z. & Richardson, A., 2005, ETS 2005:10th IEEE European Test Symposium, Proceedings. LOS ALAMITOS: IEEE COMPUTER SOC, p. 88-93 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Generation of MEMS component models using Cosserat symbolic simulations
Rosing, R., Wang, C., Tucker, R., Richardson, A. & De Masi, B., 2002, SPIE Proceedings: design, test, integration, and packaging of MEMS/MOEMS 2002. Vol. 4755. p. 149-154 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Fault simulation for MEMS
Rosing, R., Richardson, A., Dorey, A. & Peyton, A., 1/06/1999, Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on. p. 7/1 -7/6
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
A digital partial built-in self-test structure for a high performance automatic gain control circuit
Lechner, A., Ferguson, J., Richardson, A. & Hermes, B., 1999, DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS. Borrione, D. & Ernst, R. (eds.). LOS ALAMITOS: IEEE COMPUTER SOC, p. 232-238 7 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
An approach to realistic fault prediction and layout design for testability in analog circuits
Prieto, J. A., Rueda, A., Grout, I., Peralias, E., Huertas, J. L. & Richardson, A. M. D., 1998, Design, Automation and Test in Europe, 1998 Proceedings. LOS ALAMITOS: IEEE COMPUTER SOC, p. 905-909 5 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Clock switching: a new design for current test (DcT) method for dynamic logic circuits
Rosing, R., Richardson, A. M. D., Kerkhoff, A. & Acosta, A., 1998, IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on. IEEE, p. 20-25 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Reconfigurable smart sensors for dependable systems
Sharif, E., Richardson, A. & Dorey, T., 1/11/1997, Hardware Systems for Dependable Applications (Digest No: 1997/335), IEE Half-Day Colloquium on. IEEE, p. 2/1 -2/6 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
A new quality estimation methodology for mixed-signal and analogue ICs
Olbrich, T., Grout, I. A., Aimine, Y. E., Richardson, A. M. & Contensou, J., 1997, European Design and Test Conference, 1997. ED&TC 97. Proceedings . LOS ALAMITOS: I E E E, COMPUTER SOC PRESS, p. 573-580 8 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Current-mode techniques for self-testing analogue circuits
Baturone, I., SanchezSolano, S., Richardson, A. M. & Huertas, J. L., 1997, IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on . Jayasumana, AP. & Tong, C. (eds.). LOS ALAMITOS: I E E E, COMPUTER SOC PRESS, p. 33-37 5 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Fault-tolerant and self-testable architectures for zero failure electronics
Richardson, A., Sharif, E. & Betts, W. R., 1997, AUTOMOTIVE ELECTRONICS - AUTOTECH'97. EDMUNDS: MECHANICAL ENGINEERING PUBL, p. 133-142 10 p. (IMechE seminar publication ; 1997-10).
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Published
Design-for-test strategies for analogue and mixed-signal integrated circuits
Olbrich, T., Liberali, V., Maloberti, F. & Richardson, A., 1996, 38TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, PROCEEDINGS, VOLS 1 AND 2. Caloba, LP., Diniz, PSR., deQueiroz, ACM. & Watanabe, EH. (eds.). NEW YORK: Eubios Ethics Institute, p. 1139-1144 6 p.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Conference paper
Published
Towards a health monitor for system in package with MEMS functionality.
Dumas, N. & Richardson, A., 06/2006. 6 p.
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review
Published
Testing high resolution SD ADC’s by using the noise transfer function
Richardson, A. & De-Venuto, D., 26/05/2004. 0 p.
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review
Published
Reconfigurable circuits for fault tolerant systems: factors to consider
Richardson, A., Jeffrey, C. & Lechner, A., 21/06/2002, p. 215-218. 4 p.
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review
Published
Investigations of automatic built in transient step response monitoring for embedded second order charge pump phase locked loop frequency synthesizers
Richardson, A., Tijou, J., Burbidge, M. & Vaid, V., 21/06/2002, p. 23-29. 7 p.
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review
Published
Reconfiguration based built-in self-test for analogue front-end circuits
Richardson, A., Lechner, A. & Hermes, B., 18/06/1999, p. 243-247. 5 p.
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review
Published
The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality
Richardson, A. & Nicholson, R., 18/06/1999, p. 257-261. 5 p.
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review
Published
Test support strategies for MEMS
Richardson, A., Rosing, R., Peyton, A. & Dorey, A., 18/06/1999, p. 345-350. 6 p.
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review
Published
An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems
Richardson, A., Sharif, E. & Dorey, A., 11/06/1998, p. 88-90. 3 p.
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper
Published
Integrated Test Support for Micro- Electro-Mechanical-Systems (MEMS)
Richardson, A., Vermeiren, W., Straube, B. & Olbrich, T., 19/09/1996, p. 273. 8 p.
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review
Published
The application of IDDX test strategies in analogue and mixed signal IC's
Richardson, A., Bratt, A., Baturone, I. & HUERTAS, J. L., 22/06/1995. 0 p.
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review
Published
Defect oriented test development based on inductive fault analysis
Richardson, A., Kerkhoff, H. G. & Harvey, R., 22/06/1995, p. 2-11. 10 p.
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper
Other contribution
Published
Supply Current Monitoring for Testing CMOS Analog Circuits
Baturone, I., Huertas, J. L., Solano, S. S. & Richardson, A. M., 1996
Research output: Other contribution
Journal article
Published
Development of a multi frequency impedance measurement system for use in MEMS flow cytometers
Richardson, A. M. D., Cole, N. & Abdul‑Hafiz, A., 12/2017, In: Microsystem Technologies. 23, 12, p. 5527-5543 17 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
A housekeeping prognostic health management framework for microfluidic systems
Khan, H., Al-Gayem, Q. & Richardson, A. M. D., 1/06/2017, In: IEEE Transactions on Device and Materials Reliability. 17, 2, p. 438-449 12 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
Use of self-calibration data for multifunctional MEMS sensor prognostics
Khan, H., Tahir, M. I. & Richardson, A. M. D., 08/2016, In: Journal of Micromechanical Systems. 25, 4, p. 761-769 9 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
Test strategies for electrode degradation in bio-fluidic microsystems.
Al-Gayem, Q., Honguan, L., Richardson, A. & Burd, N., 02/2011, In: Journal of Electronic Testing. 27, 1, p. 57-68 12 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
An oscillation-based technique for degradation monitoring of sensing and actuation electrodes within microfluidic systems.
Al-Gayem, Q., Richardson, A., Liu, H. & Burd, N., 02/2011, In: Journal of Electronic Testing. 27, 3, p. 375-387 13 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
Design and simulation of a multi-function MEMS sensor for health and usage monitoring.
Xu, Z., Kotsov, D., Richardson, A., Li, L. & Begbie, M., 12/01/2010, In: Proceedings of IEEE Prognostics & System Health Management Conference. p. 1-7 7 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
Online Testing of MEMS Based on Encoded Stimulus Superposition.
Dumas, N., Xu, Z., Georgopolis, K., Bunyan, J. & Richardson, A., 12/2008, In: Journal of Electronic Testing. 24, 6, p. 555-566 12 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
Failure mechanisms of legacy aircraft wiring and interconnects
Moffat, B. G., Abraham, E., Desmulliez, M. P. Y., Koltsov, D. & Richardson, A., 06/2008, In: IEEE Transactions on Dielectrics and Electrical Insulation. 15, 3, p. 808-822 15 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
An Embedded Test & Health Monitoring Strategy for Detecting and Locating Faults in Aerospace Bus Systems.
Hannu, J., Koltsov, D., Xu, Z., Richardson, A. & Moilanen, M., 2008, In: Proceedings of the IEEE .
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
A Dependable Microelectronic Peptide Synthesizer Using Electrode Data
Richardson, A., Kerkhoff, H. G., Zhang, X., Mailly, F., Nouet, P. & Liu, H., 2008, In: VLSI Design. 2008, n/a, 9 p., 437879.
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Published
Sensor Testing Through Bias Superposition.
Richardson, A. M. D., Bunyan, R., Mathias, H. & Nouet, P., 1/05/2007, In: Sensors and Actuators A: Physical. 136, 1, p. 441-455 15 p.
Research output: Contribution to Journal/Magazine › Journal article › peer-review

Previous 1 2 Next

Research

Professor Andrew Richardson

Quick Links

Connect With Us