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Research

Professor Anthony Dorey

Emeritus

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  1. 2001
  2. Published

    Finite element analysis to support component level fault modelling for MEMS.

    Reichenbach, R., Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2001, Proceedings of SPIE design, test, integration and packaging of MEMS symposium. Vol. 4408. p. 147-158 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  3. Published

    Generation of component level fault models for MEMS.

    Rosing, R., Reichenbach, R., Richardson, A. M. D. & Dorey, A. P., 2001, Proceedings of the 7th international mixed-signal testing workshop (IMSTW ’01). p. 40-45 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  4. 2000
  5. Published

    A conceptual study for a computer-based tool to support electronics design in a mechatronic environment.

    Bradley, D. A., Walters, R. M. & Dorey, A. P., 2000, In: Microprocessors and Microsystems. 24, 2, p. 51-61 11 p.

    Research output: Contribution to Journal/Magazine › Journal article

  6. Published

    A fault simulation methodology for MEMS.

    Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2000, Proceedings of the design automation and test in Europe conference. Paris: IEEE, p. 476-483 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  7. Published

    A fault simulation methodology for MEMS.

    Rosing, R., Richardson, A. M. D. & Dorey, A. P., 2000, Proceedings of the IEE symposium on quality and automation (RESQUA 2000). Penang, Malaysia

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  8. Published

    Fault simulation and modelling of microelectromechanical systems.

    Rosing, R., Lechner, A., Richardson, A. M. D. & Dorey, A. P., 2000, In: IEE Journal on Computing and Control Engineering. 11, 5, p. 242-250 9 p.

    Research output: Contribution to Journal/Magazine › Journal article

  9. 1999
  10. Published

    Test support strategies for MEMS

    Richardson, A., Rosing, R., Peyton, A. & Dorey, A., 18/06/1999, p. 345-350. 6 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  11. Published

    Fault simulation for MEMS

    Rosing, R., Richardson, A., Dorey, A. & Peyton, A., 1/06/1999, Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on. p. 7/1 -7/6

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  12. 1998
  13. Published

    An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems

    Richardson, A., Sharif, E. & Dorey, A., 11/06/1998, p. 88-90. 3 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper

  14. Published

    An integrated diagnostic reconfiguration (IDR) technique for fault tolerant mixed signal microsystems.

    Sharif, E., Dorey, A. P. & Richardson, A. M. D., 1998, Proceedings of the IEEE international circuits and systems symposium. IEEE

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  15. 1996
  16. Published

    Mixed signal test - Techniques, applications and demands

    Baker, K., Richardson, A. M. & Dorey, A. P., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 358-365 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  17. 1995
  18. Published

    A design-for-test structure for optimising analogue and mixed signal IC test

    Bratt, A., Richardson, A. M. D., Harvey, R. & Dorey, A. P., 03/1995, European Design and Test Conference. IEEE, p. 24-33 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  19. Published

    The design and testing of a PI controller ASIC.

    Grout, I. A., Burge, S. E. & Dorey, A. P., 1995, In: Microprocessors and Microsystems. 19, 1, p. 15-22 8 p.

    Research output: Contribution to Journal/Magazine › Journal article

  20. 1994
  21. Published

    Class AB cascode current memory cell.

    Bratt, A., Olbrich, T. & Dorey, A. P., 10/1994, In: Electronics Letters. 30, 22, p. 1821-1823 3 p.

    Research output: Contribution to Journal/Magazine › Journal article

  22. Published

    Application specific integrated circuit implementation of siso control laws.

    Burge, S. E., Grout, I. A. & Dorey, A. P., 1994, Proceedings of the IEE international conference on control '94. London: IEE, p. 1104-1110 7 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  23. Published

    Application specific integrated circuit processors for discrete-time control.

    Grout, I. A., Burge, S. E. & Dorey, A. P., 1994, Proceedings of the Irish DSP and control colloquium. Dubai, p. 277-282 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  24. Published

    ASICs for monitoring and controlling electric motors.

    Grout, I. A., Burge, S. E. & Dorey, A. P., 1994, Application Specific Integrated Circuits for Measurement Systems, IEE Colloquium on. IET Press, p. 10/1-10/4 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  25. Published

    Measurement science and technology - essential fundamentals of mechatronics.

    Dorey, A. P. & Bradley, D. A., 1994, In: Measurement Science and Technology. 5, 12, p. 1415-1428 14 p.

    Research output: Contribution to Journal/Magazine › Journal article

  26. 1993
  27. Published

    A review of testing methods for mixed signal ICs.

    Harvey, R. J. A., Bratt, A. H. & Dorey, A. P., 1993, In: Microelectronics Journal. 24, 6, p. 663-674 12 p.

    Research output: Contribution to Journal/Magazine › Journal article

  28. Published

    Aspects of current reference generation and distribution for IDDx pass/fail current determination.

    Bratt, A., Harvey, R. J. A., Dorey, A. P. & Richardson, A. M. D., 1993, Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  29. Published

    Design-for-test structure to facilitate test vector application with low performance loss in non-test mode.

    Bratt, A., Harvey, R. J. A., Dorey, A. P. & Richardson, A. M. D., 1993, In: Electronics Letters. 29, 16, p. 1438-1440 3 p.

    Research output: Contribution to Journal/Magazine › Journal article

  30. 1992
  31. Published

    An integrated electronic degree scheme - the Lancaster electronics course.

    Bradley, D. A., Dorey, A. P., Silvester, P. J. & Adelson, R. M., 1992, Innovative teaching in engineering. Smith, R. A. (ed.). London: Ellis Horwood, 530 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  32. Published

    Analogue behavioural modelling at systems level.

    Bratt, A., Harvey, R. J. A. & Dorey, A. P., 1992, IEE PG EC10/C11 colloquium on linear analogue circuits and systems. IEE, Vol. 158. p. 14/1-14/9

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  33. Published

    Integrating electronics with mechanical engineering.

    Dorey, A. P. & Bradley, D. A., 1992, 6th conference on teaching electronic engineering in degree courses. University of Hull, p. 28.1-28.8

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  34. Published

    Mathematics in electronic engineering

    Tunnicliffe-Wilson, J. C. & Dorey, A. P., 1992, 6th conference on teaching electronic engineering in degree courses. Hull, p. 43/1-43/9

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  35. Published

    Reliability indicators.

    Richardson, A. M. D. & Dorey, A. P., 1992, Third European symposium of reliability of electron devices, failure, physics and analysis (ESREF). Schabisch Gmund, p. 277-285 9 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  36. Published

    Supply current monitoring in cmos circuits for reliability prediction and test.

    Richardson, A. M. D. & Dorey, A. P., 1992, In: Quality and Reliability Engineering International. 8, 6, p. 543-548 6 p.

    Research output: Contribution to Journal/Magazine › Journal article

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