• Published

  Quantifying thermal transport in buried semiconductor nanostructures via Cross-Sectional Scanning Thermal Microscopy

  Spiece, J., Evangeli, C., Robson, A., Sachat, A., Hanel, L., Alonso, M., Garriga, M., Robinson, B., Oehme, M., Schulze, J., Alzina, F., Sotomayor-Torres, C. M. & Kolosov, O., 28/06/2021, In: Nanoscale. 13, 24, p. 10829-10836 8 p.

  Research output: Contribution to Journal/Magazine › Journal article › peer-review

• Published

  Correlation of nano-scale electrical and topographical mapping of buried nanoscale semiconductor junctions

  Alsharif, G., Hanel, L., Robson, A. J., Schultze, J., Robinson, B. J. & Kolosov, O. V., 3/07/2017. 2 p.

  Research output: Contribution to conference - Without ISBN/ISSN › Abstract › peer-review

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