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A new methodology for IC product quality estima...
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School of Engineering
Associated organisational unit
Engineering of Microwaves, Terahertz and Light (E-MIT)
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A new methodology for IC product quality estimation.
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Contribution in Book/Report/Proceedings - With ISBN/ISSN
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Overview
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T. Olbrich
I. Grout
Y. Eben Aimine
A. Richardson
J. Contensou
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Publication date
1997
Host publication
Proceedings of the European design and test conference (ED&TC '97)
Place of Publication
Paris
Publisher
IEEE Computer Society Press
ISBN (print)
0818677864.
<mark>Original language</mark>
English