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Defect oriented test development based on inductive fault analysis

Research output: Contribution to conference - Without ISBN/ISSN › Conference paper

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Publication date22/06/1995
Number of pages10
Pages2-11
<mark>Original language</mark>English
EventIEEE International Mixed Signal Test Workshop - Vilard de Larns, France
Duration: 20/06/1995 → 22/06/1995

Conference

ConferenceIEEE International Mixed Signal Test Workshop
Country/TerritoryFrance
CityVilard de Larns
Period20/06/95 → 22/06/95

Abstract

This paper describes a method of developing a Defect Oriented Test (DOT) strategy by using Inductive Fault Analysis (IFA) and layout dependent fault models extracted from process defect statistics. The results of a quantitative prediction of the effectiveness of several test strategies, such as functional, IDDQ, and a low voltage power supply method, on a current-mode Digital to Analogue Converter are discussed and show that no single test method is superior.