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Testing high resolution SD ADC’s by using the noise transfer function

Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

Published
Publication date26/05/2004
Number of pages0
<mark>Original language</mark>English
Event9th IEEE European Test Symposium - Corsica, France
Duration: 23/05/2004 → 26/05/2004

Conference

Conference9th IEEE European Test Symposium
Country/TerritoryFrance
CityCorsica
Period23/05/04 → 26/05/04

Abstract

A new solution to improve the testability of high resolution SD Analogue to Digital Converters (SD ADC’s) using the quantizer input as test node is described. The theoretical basis for the technique is discussed and results from high level simulations for a 16 bit, 4th order, audio ADC are presented. The analysis
demonstrates the potential to reduce the computational effort associated with test response analysis versus conventional techniques.