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Phonological short term-memory, working memory and foreign language performance in intensive language learning.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Published
<mark>Journal publication date</mark>07/2008
<mark>Journal</mark>Bilingualism: Language and Cognition
Issue number2
Volume11
Number of pages11
Pages (from-to)261-271
Publication StatusPublished
<mark>Original language</mark>English

Abstract

In our research we addressed the question what the relationship is between phonological short-term and working memory capacity and performance in an end-of-year reading, writing, listening, speaking and use of English test. The participants of our study were 121 secondary school students aged 15–16 in the first intensive language training year of a bilingual education program in Hungary. The participants performed a non-word repetition test and took a Cambridge First Certificate Exam. Fifty students were also tested with a backward digit span test, measuring their working memory capacity. Our study indicates that phonological short-term memory capacity plays a different role in the case of beginners and pre-intermediate students in intensive language learning. The backward digit span test correlated very highly with the overall English language competence, as well as with reading, listening, speaking and use of English (vocabulary and grammar) test scores.

Bibliographic note

http://journals.cambridge.org/action/displayJournal?jid=UHY The final, definitive version of this article has been published in the Journal, Bilingualism : Language and Cognition, 11 (2), pp 261-271 2008, © 2008 Cambridge University Press.