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Editorial: Mixed signal & analogue IC test tech...
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School of Engineering
Associated organisational unit
Engineering of Microwaves, Terahertz and Light (E-MIT)
Links
http://dx.doi.org/10.1049/ip-cds:19960955
Text available via DOI:
https://doi.org/10.1049/ip-cds:19960955
Final published version
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Editorial: Mixed signal & analogue IC test technology
Research output
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Contribution to Journal/Magazine
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Editorial
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peer-review
Published
Overview
Cite this
A Richardson
T Dorey
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<mark>Journal publication date</mark>
12/1996
<mark>Journal</mark>
IEE Proceedings - Circuits, Devices and Systems
Issue number
6
Volume
143
Number of pages
1
Pages (from-to)
357-357
Publication Status
Published
<mark>Original language</mark>
English