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THz near-field microscopy: a review

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Publication date2006
Host publicationInfrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
PublisherIEEE
Pages441
Number of pages1
ISBN (print)1424404002
<mark>Original language</mark>English

Abstract

One of the major limitations of THz imaging is low spatial resolution. Consequently, various techniques have been proposed in the literature to break the diffraction limit. Many of the existing techniques draw inspiration from near-field scanning optical microscopy, while other techniques tightly focus optical beams to reduce the size of the generated THz beams. This paper reviews briefly the existing THz near-field methods and recent developments for identifying possible areas of research potential.