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Test techniques for embedded charge pump phase-...
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School of Engineering
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Engineering of Microwaves, Terahertz and Light (E-MIT)
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Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.
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Chapter
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Overview
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M. Burbidge
Andrew M. D. Richardson
A. Lechner
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Publication date
2001
Host publication
Proceedings of the 7th IEEE international test workshop
Pages
97-102
Number of pages
6
<mark>Original language</mark>
English