Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Publication date | 1998 |
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Host publication | Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE |
Editors | S. C. Schneider, M. Levy, B. R. McAvoy |
Place of Publication | New York |
Publisher | IEEE |
Pages | 1255-1259 |
Number of pages | 5 |
Volume | 2 |
ISBN (print) | 0-7803-4096-5 |
<mark>Original language</mark> | English |
Event | 1998 IEEE Ultrasonics Symposium - SENDAI Duration: 5/10/1998 → 8/10/1998 |
Conference | 1998 IEEE Ultrasonics Symposium |
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City | SENDAI |
Period | 5/10/98 → 8/10/98 |
Conference | 1998 IEEE Ultrasonics Symposium |
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City | SENDAI |
Period | 5/10/98 → 8/10/98 |
We present experimental results that extend the frequency range of ultrasonic force microscopy (UFM) to 100 MHz, operating in a mode in which the cantilever base is vibrated. In this "waveguide-UFM" mode flexural ultrasonic vibrations are launched down the cantilever as in a waveguide, without exciting any particular cantilever resonance. The nonlinearity of the tip-sample force-distance curve allows the conversion of a modulated ultrasonic frequency into a low frequency vibration of the cantilever, detected using an optical lever at the modulation frequency in an conventional atomic force microscope. Experiments were performed on a sample of InAs self-assembled quantum dots on a GaAs substrate. The dots, of order 10-100 nm in diameter, were clearly resolved up to operating frequencies similar to 100 MHZ, demonstrating the difference in elastic properties. Images were also obtained for a polycrystalline chromium film structure deposited on a silicon substrate.