Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
| Publication date | 2009 |
|---|---|
| Host publication | 2009 IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE |
| Place of Publication | NEW YORK |
| Publisher | IEEE |
| Pages | 159-160 |
| Number of pages | 2 |
| ISBN (print) | 978-1-4244-3500-5 |
| <mark>Original language</mark> | English |
| Event | 10th IEEE International Vacuum Electronics Conference - Rome Duration: 28/04/2009 → 30/04/2009 |
| Conference | 10th IEEE International Vacuum Electronics Conference |
|---|---|
| City | Rome |
| Period | 28/04/09 → 30/04/09 |
| Conference | 10th IEEE International Vacuum Electronics Conference |
|---|---|
| City | Rome |
| Period | 28/04/09 → 30/04/09 |
The knowledge and the control of fabrication tolerance are key issues to get the required traveling wave tube performance. The comprehension of the factors that mainly determine a yield degradation is required to avoid higher costs in the manufacturing process. This paper proposes a method to improve the yield of multi-section helix traveling wave tubes before the fabrication. Small-signal gain performance goal is assumed as the design target.