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Short circuit faults in state-of-the-art ADCs –...
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School of Engineering
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Engineering of Microwaves, Terahertz and Light (E-MIT)
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Short circuit faults in state-of-the-art ADCs – are they hard or soft?
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Contribution in Book/Report/Proceedings - With ISBN/ISSN
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Chapter
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Overview
Cite this
A. Lechner
Andrew M. D. Richardson
B. Hermes
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Publication date
2001
Host publication
10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan
Publisher
IEEE Computer Society
Pages
417-422
Number of pages
6
ISBN (print)
0769513786 9780769513782
<mark>Original language</mark>
English