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Home > Research > Publications & Outputs > 3DB challenge for DfT, DfM, DOT and BIST integr...
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3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs.

Research output: Contribution in Book/Report/ProceedingsChapter

Published

Associated organisational unit

Publication date2001
Host publicationProceedings of the 2nd Latin-American test workshop (LATW ’01)
Pages194-199
Number of pages6
Original languageEnglish