Home > Research > Publications & Outputs > 3DB challenge for DfT, DfM, DOT and BIST integr...

Research

Associated organisational unit

View graph of relations

3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Published

Standard

3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs. / Lechner, A.; Burbidge, M. J.; Richardson, Andrew M. D. et al.
Proceedings of the 2nd Latin-American test workshop (LATW ’01). 2001. p. 194-199.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Harvard

Lechner, A, Burbidge, MJ, Richardson, AMD & Hermes, B 2001, 3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs. in Proceedings of the 2nd Latin-American test workshop (LATW ’01). pp. 194-199.

APA

Lechner, A., Burbidge, M. J., Richardson, A. M. D., & Hermes, B. (2001). 3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs. In Proceedings of the 2nd Latin-American test workshop (LATW ’01) (pp. 194-199)

Vancouver

Lechner A, Burbidge MJ, Richardson AMD, Hermes B. 3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs. In Proceedings of the 2nd Latin-American test workshop (LATW ’01). 2001. p. 194-199

Author

Lechner, A. ; Burbidge, M. J. ; Richardson, Andrew M. D. et al. / 3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs. Proceedings of the 2nd Latin-American test workshop (LATW ’01). 2001. pp. 194-199

Bibtex

@inbook{c18d5f609835478d87173b4d28fdc0d8,
title = "3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs.",
author = "A. Lechner and Burbidge, {M. J.} and Richardson, {Andrew M. D.} and B. Hermes",
year = "2001",
language = "English",
pages = "194--199",
booktitle = "Proceedings of the 2nd Latin-American test workshop (LATW {\textquoteright}01)",

}

RIS

TY - CHAP

T1 - 3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs.

AU - Lechner, A.

AU - Burbidge, M. J.

AU - Richardson, Andrew M. D.

AU - Hermes, B.

PY - 2001

Y1 - 2001

M3 - Chapter

SP - 194

EP - 199

BT - Proceedings of the 2nd Latin-American test workshop (LATW ’01)

ER -