Research output: Contribution in Book/Report/Proceedings › Conference contribution
|Host publication||DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS|
|Editors||D Borrione, R Ernst|
|Place of publication||LOS ALAMITOS|
|Publisher||IEEE COMPUTER SOC|
|Number of pages||7|
It is now widely recognised that Design-for-Testability and Built-in Self-Test techniques rc ill be mandatory to meet test and quality specifications in next generation mired signal integrated systems. This paper describes a new digital on-chip post processing function capable of reducing production test time for a high performance automatic gain control circuit by 70%.