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A new methodology for IC product quality estimation. / Olbrich, T.; Grout, I.; Eben Aimine, Y. et al.
Proceedings of the European design and test conference (ED&TC '97). Paris: IEEE Computer Society Press, 1997.
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Olbrich, T, Grout, I, Eben Aimine, Y
, Richardson, A & Contensou, J 1997,
A new methodology for IC product quality estimation. in
Proceedings of the European design and test conference (ED&TC '97). IEEE Computer Society Press, Paris.
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Bibtex
@inbook{28d2c5bad91d495cbfca55d243d9edcc,
title = "A new methodology for IC product quality estimation.",
author = "T. Olbrich and I. Grout and {Eben Aimine}, Y. and A. Richardson and J. Contensou",
year = "1997",
language = "English",
isbn = "0818677864.",
booktitle = "Proceedings of the European design and test conference (ED&TC '97)",
publisher = "IEEE Computer Society Press",
}
RIS
TY - CHAP
T1 - A new methodology for IC product quality estimation.
AU - Olbrich, T.
AU - Grout, I.
AU - Eben Aimine, Y.
AU - Richardson, A.
AU - Contensou, J.
PY - 1997
Y1 - 1997
M3 - Chapter
SN - 0818677864.
BT - Proceedings of the European design and test conference (ED&TC '97)
PB - IEEE Computer Society Press
CY - Paris
ER -
