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A new quality estimation methodology for mixed-signal and analogue ICs

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Publication date1997
Host publicationEuropean Design and Test Conference, 1997. ED&TC 97. Proceedings
Place of PublicationLOS ALAMITOS
PublisherI E E E, COMPUTER SOC PRESS
Pages573-580
Number of pages8
ISBN (Print)0-8186-7786-4
<mark>Original language</mark>English

Abstract

IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a qualify estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the qualify related parameters prior to production. It is shown how the approach can be used to optimise the manufacturing test program.