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A simplified model to estimate thermal resistance between carbon nanotube and sample in scanning thermal microscopy

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A simplified model to estimate thermal resistance between carbon nanotube and sample in scanning thermal microscopy. / Nazarenko, Maxim; Rosamond, Mark; Gallant, Andrew J.; Kolosov, Oleg Victor; Dubrovskii, Vladimir G.; Zeze, Dagou A.

In: Journal of Physics D: Applied Physics, Vol. 50, No. 49, 494004, 15.11.2017.

Research output: Contribution to journalJournal article

Harvard

Nazarenko, M, Rosamond, M, Gallant, AJ, Kolosov, OV, Dubrovskii, VG & Zeze, DA 2017, 'A simplified model to estimate thermal resistance between carbon nanotube and sample in scanning thermal microscopy', Journal of Physics D: Applied Physics, vol. 50, no. 49, 494004. https://doi.org/10.1088/1361-6463/aa900e

APA

Nazarenko, M., Rosamond, M., Gallant, A. J., Kolosov, O. V., Dubrovskii, V. G., & Zeze, D. A. (2017). A simplified model to estimate thermal resistance between carbon nanotube and sample in scanning thermal microscopy. Journal of Physics D: Applied Physics, 50(49), [494004]. https://doi.org/10.1088/1361-6463/aa900e

Vancouver

Nazarenko M, Rosamond M, Gallant AJ, Kolosov OV, Dubrovskii VG, Zeze DA. A simplified model to estimate thermal resistance between carbon nanotube and sample in scanning thermal microscopy. Journal of Physics D: Applied Physics. 2017 Nov 15;50(49). 494004. https://doi.org/10.1088/1361-6463/aa900e

Author

Nazarenko, Maxim ; Rosamond, Mark ; Gallant, Andrew J. ; Kolosov, Oleg Victor ; Dubrovskii, Vladimir G. ; Zeze, Dagou A. / A simplified model to estimate thermal resistance between carbon nanotube and sample in scanning thermal microscopy. In: Journal of Physics D: Applied Physics. 2017 ; Vol. 50, No. 49.

Bibtex

@article{d4a1aefa3a3a49a69b01ed75bebecae8,
title = "A simplified model to estimate thermal resistance between carbon nanotube and sample in scanning thermal microscopy",
abstract = "Scanning Thermal Microscopy (SThM) is an attractive technique for nanoscale thermal measurements. Multiwalled carbon nanotubes (MWCNT) can be used to enhance a SThM probe in order to drastically increase spatial resolution while keeping required thermal sensitivity. However, an accurate prediction of the thermal resistance at the interface between the MWCNT-enhanced probe tip and a sample under study is essential for the accurate interpretation of experimental measurements. Unfortunately, there is very little literature on Kapitsa interfacial resistance involving carbon nanotubes under SThM configuration. We propose a model for heat conductance through an interface between the MWCNT tip and the sample, which estimates the thermal resistance based on phonon and geometrical properties of the MWCNT and the sample, without neglecting the diamond-like carbon layer covering the MWCNT tip. The model considers acoustic phonons as the main heat carriers and account for their scattering at the interface based on a fundamental quantum mechanical approach. The predicted value of the thermal resistance is then compared with experimental data available in the literature. Theoretical predictions and experimental results are found to be of the same order of magnitude, suggesting a simplified, yet realistic model to approximate thermal resistance between carbon nanotube and sample in SThM, albeit low temperature measurements are needed to achieve a better match between theory and experiment. As a result, several possible avenues are outlined to achieve more accurate predictions and to generalize the model.",
keywords = "SThM, scanning thermal microscopy, CNT, CARBON NANOTUBES, nanoscale thermal transporty",
author = "Maxim Nazarenko and Mark Rosamond and Gallant, {Andrew J.} and Kolosov, {Oleg Victor} and Dubrovskii, {Vladimir G.} and Zeze, {Dagou A.}",
year = "2017",
month = nov
day = "15",
doi = "10.1088/1361-6463/aa900e",
language = "English",
volume = "50",
journal = "Journal of Physics D: Applied Physics",
issn = "0022-3727",
publisher = "IOP Publishing Ltd",
number = "49",

}

RIS

TY - JOUR

T1 - A simplified model to estimate thermal resistance between carbon nanotube and sample in scanning thermal microscopy

AU - Nazarenko, Maxim

AU - Rosamond, Mark

AU - Gallant, Andrew J.

AU - Kolosov, Oleg Victor

AU - Dubrovskii, Vladimir G.

AU - Zeze, Dagou A.

PY - 2017/11/15

Y1 - 2017/11/15

N2 - Scanning Thermal Microscopy (SThM) is an attractive technique for nanoscale thermal measurements. Multiwalled carbon nanotubes (MWCNT) can be used to enhance a SThM probe in order to drastically increase spatial resolution while keeping required thermal sensitivity. However, an accurate prediction of the thermal resistance at the interface between the MWCNT-enhanced probe tip and a sample under study is essential for the accurate interpretation of experimental measurements. Unfortunately, there is very little literature on Kapitsa interfacial resistance involving carbon nanotubes under SThM configuration. We propose a model for heat conductance through an interface between the MWCNT tip and the sample, which estimates the thermal resistance based on phonon and geometrical properties of the MWCNT and the sample, without neglecting the diamond-like carbon layer covering the MWCNT tip. The model considers acoustic phonons as the main heat carriers and account for their scattering at the interface based on a fundamental quantum mechanical approach. The predicted value of the thermal resistance is then compared with experimental data available in the literature. Theoretical predictions and experimental results are found to be of the same order of magnitude, suggesting a simplified, yet realistic model to approximate thermal resistance between carbon nanotube and sample in SThM, albeit low temperature measurements are needed to achieve a better match between theory and experiment. As a result, several possible avenues are outlined to achieve more accurate predictions and to generalize the model.

AB - Scanning Thermal Microscopy (SThM) is an attractive technique for nanoscale thermal measurements. Multiwalled carbon nanotubes (MWCNT) can be used to enhance a SThM probe in order to drastically increase spatial resolution while keeping required thermal sensitivity. However, an accurate prediction of the thermal resistance at the interface between the MWCNT-enhanced probe tip and a sample under study is essential for the accurate interpretation of experimental measurements. Unfortunately, there is very little literature on Kapitsa interfacial resistance involving carbon nanotubes under SThM configuration. We propose a model for heat conductance through an interface between the MWCNT tip and the sample, which estimates the thermal resistance based on phonon and geometrical properties of the MWCNT and the sample, without neglecting the diamond-like carbon layer covering the MWCNT tip. The model considers acoustic phonons as the main heat carriers and account for their scattering at the interface based on a fundamental quantum mechanical approach. The predicted value of the thermal resistance is then compared with experimental data available in the literature. Theoretical predictions and experimental results are found to be of the same order of magnitude, suggesting a simplified, yet realistic model to approximate thermal resistance between carbon nanotube and sample in SThM, albeit low temperature measurements are needed to achieve a better match between theory and experiment. As a result, several possible avenues are outlined to achieve more accurate predictions and to generalize the model.

KW - SThM

KW - scanning thermal microscopy

KW - CNT

KW - CARBON NANOTUBES

KW - nanoscale thermal transporty

U2 - 10.1088/1361-6463/aa900e

DO - 10.1088/1361-6463/aa900e

M3 - Journal article

VL - 50

JO - Journal of Physics D: Applied Physics

JF - Journal of Physics D: Applied Physics

SN - 0022-3727

IS - 49

M1 - 494004

ER -