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Achievement Tests. Aptitude tests. Diagnostic tests. DIALANG. Dictation. Direct/Indirect testing. Discrete point tests. Integrated tests. Integrative tests. Placement tests. Proficiency tests. Progress tests. Reliability. Validity.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Entry for encyclopedia/dictionary

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Achievement Tests. Aptitude tests. Diagnostic tests. DIALANG. Dictation. Direct/Indirect testing. Discrete point tests. Integrated tests. Integrative tests. Placement tests. Proficiency tests. Progress tests. Reliability. Validity. / Brunfaut, Tineke; Banerjee, Jayanti.
Routledge encyclopedia of language teaching and learning. ed. / Michael Byram; Adelheid Hu. 2nd. ed. London: Routledge, 2012. p. 3-4; 40-41; 193; 193-194; 194; 202; 205; 335; 335-336; 529; 559; 560; 591-593; 761-672.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Entry for encyclopedia/dictionary

Harvard

Brunfaut, T & Banerjee, J 2012, Achievement Tests. Aptitude tests. Diagnostic tests. DIALANG. Dictation. Direct/Indirect testing. Discrete point tests. Integrated tests. Integrative tests. Placement tests. Proficiency tests. Progress tests. Reliability. Validity. in M Byram & A Hu (eds), Routledge encyclopedia of language teaching and learning. 2nd edn, Routledge, London, pp. 3-4; 40-41; 193; 193-194; 194; 202; 205; 335; 335-336; 529; 559; 560; 591-593; 761-672.

APA

Brunfaut, T., & Banerjee, J. (2012). Achievement Tests. Aptitude tests. Diagnostic tests. DIALANG. Dictation. Direct/Indirect testing. Discrete point tests. Integrated tests. Integrative tests. Placement tests. Proficiency tests. Progress tests. Reliability. Validity. In M. Byram, & A. Hu (Eds.), Routledge encyclopedia of language teaching and learning (2nd ed., pp. 3-4; 40-41; 193; 193-194; 194; 202; 205; 335; 335-336; 529; 559; 560; 591-593; 761-672). Routledge.

Vancouver

Brunfaut T, Banerjee J. Achievement Tests. Aptitude tests. Diagnostic tests. DIALANG. Dictation. Direct/Indirect testing. Discrete point tests. Integrated tests. Integrative tests. Placement tests. Proficiency tests. Progress tests. Reliability. Validity. In Byram M, Hu A, editors, Routledge encyclopedia of language teaching and learning. 2nd ed. London: Routledge. 2012. p. 3-4; 40-41; 193; 193-194; 194; 202; 205; 335; 335-336; 529; 559; 560; 591-593; 761-672

Author

Brunfaut, Tineke ; Banerjee, Jayanti. / Achievement Tests. Aptitude tests. Diagnostic tests. DIALANG. Dictation. Direct/Indirect testing. Discrete point tests. Integrated tests. Integrative tests. Placement tests. Proficiency tests. Progress tests. Reliability. Validity. Routledge encyclopedia of language teaching and learning. editor / Michael Byram ; Adelheid Hu. 2nd. ed. London : Routledge, 2012. pp. 3-4; 40-41; 193; 193-194; 194; 202; 205; 335; 335-336; 529; 559; 560; 591-593; 761-672

Bibtex

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title = "Achievement Tests. Aptitude tests. Diagnostic tests. DIALANG. Dictation. Direct/Indirect testing. Discrete point tests. Integrated tests. Integrative tests. Placement tests. Proficiency tests. Progress tests. Reliability. Validity.",
author = "Tineke Brunfaut and Jayanti Banerjee",
year = "2012",
language = "English",
isbn = "9780415593762",
pages = "3--4; 40--41; 193; 193--194; 194; 202; 205; 335; 335--336; 529; 559; 560; 591--593; 761--672",
editor = "Michael Byram and Adelheid Hu",
booktitle = "Routledge encyclopedia of language teaching and learning",
publisher = "Routledge",
edition = "2nd",

}

RIS

TY - CHAP

T1 - Achievement Tests. Aptitude tests. Diagnostic tests. DIALANG. Dictation. Direct/Indirect testing. Discrete point tests. Integrated tests. Integrative tests. Placement tests. Proficiency tests. Progress tests. Reliability. Validity.

AU - Brunfaut, Tineke

AU - Banerjee, Jayanti

PY - 2012

Y1 - 2012

M3 - Entry for encyclopedia/dictionary

SN - 9780415593762

SP - 3-4; 40-41; 193; 193-194; 194; 202; 205; 335; 335-336; 529; 559; 560; 591-593; 761-672

BT - Routledge encyclopedia of language teaching and learning

A2 - Byram, Michael

A2 - Hu, Adelheid

PB - Routledge

CY - London

ER -