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    Rights statement: Copyright 2000 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in AIP Conference Proceedings, 511, 2000 and may be found at http://scitation.aip.org/content/aip/proceeding/aipcp/10.1063/1.60005

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Activated escape of driven systems

Research output: Contribution to Journal/MagazineJournal article

Published

Standard

Activated escape of driven systems. / Dykman, Mark; Khovanov, I. A.; Luchinsky, D. G. et al.
In: AIP Conference Proceedings, Vol. 511, 2000, p. 515-520.

Research output: Contribution to Journal/MagazineJournal article

Harvard

Dykman, M, Khovanov, IA, Luchinsky, DG, Mannella, R, McClintock, PVE & Smelyanskiy, VN 2000, 'Activated escape of driven systems', AIP Conference Proceedings, vol. 511, pp. 515-520. https://doi.org/10.1063/1.60005

APA

Dykman, M., Khovanov, I. A., Luchinsky, D. G., Mannella, R., McClintock, P. V. E., & Smelyanskiy, V. N. (2000). Activated escape of driven systems. AIP Conference Proceedings, 511, 515-520. https://doi.org/10.1063/1.60005

Vancouver

Dykman M, Khovanov IA, Luchinsky DG, Mannella R, McClintock PVE, Smelyanskiy VN. Activated escape of driven systems. AIP Conference Proceedings. 2000;511:515-520. doi: 10.1063/1.60005

Author

Dykman, Mark ; Khovanov, I. A. ; Luchinsky, D. G. et al. / Activated escape of driven systems. In: AIP Conference Proceedings. 2000 ; Vol. 511. pp. 515-520.

Bibtex

@article{8ebcca3fcad248fa9832541c31ccb064,
title = "Activated escape of driven systems",
abstract = "The problem of activated escape in a far-from-equilibrium system is analysed theoretically, numerically and by analogue electronic experiments. The process is shown to occur via optimal fluctuations that are well described, under diverse conditions, in terms of a new physical quantity, the logarithmic susceptibility (LS).",
author = "Mark Dykman and Khovanov, {I. A.} and Luchinsky, {D. G.} and R. Mannella and McClintock, {Peter V. E.} and Smelyanskiy, {V. N.}",
note = "Copyright 2000 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in AIP Conference Proceedings, 511, 2000 and may be found at http://scitation.aip.org/content/aip/proceeding/aipcp/10.1063/1.60005 ",
year = "2000",
doi = "10.1063/1.60005",
language = "English",
volume = "511",
pages = "515--520",
journal = "AIP Conference Proceedings",
issn = "0094-243X",
publisher = "American Institute of Physics Publising LLC",

}

RIS

TY - JOUR

T1 - Activated escape of driven systems

AU - Dykman, Mark

AU - Khovanov, I. A.

AU - Luchinsky, D. G.

AU - Mannella, R.

AU - McClintock, Peter V. E.

AU - Smelyanskiy, V. N.

N1 - Copyright 2000 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in AIP Conference Proceedings, 511, 2000 and may be found at http://scitation.aip.org/content/aip/proceeding/aipcp/10.1063/1.60005

PY - 2000

Y1 - 2000

N2 - The problem of activated escape in a far-from-equilibrium system is analysed theoretically, numerically and by analogue electronic experiments. The process is shown to occur via optimal fluctuations that are well described, under diverse conditions, in terms of a new physical quantity, the logarithmic susceptibility (LS).

AB - The problem of activated escape in a far-from-equilibrium system is analysed theoretically, numerically and by analogue electronic experiments. The process is shown to occur via optimal fluctuations that are well described, under diverse conditions, in terms of a new physical quantity, the logarithmic susceptibility (LS).

U2 - 10.1063/1.60005

DO - 10.1063/1.60005

M3 - Journal article

VL - 511

SP - 515

EP - 520

JO - AIP Conference Proceedings

JF - AIP Conference Proceedings

SN - 0094-243X

ER -