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Analogue Fault Simulation Based on Layout-Dependent Fault Models.

Research output: Contribution in Book/Report/ProceedingsChapter


Associated organisational unit

Publication date1994
Host publicationProceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Place of publicationWashington, DC, USA
PublisherIEEE Computer Society
Number of pages9
ISBN (Print)0-7803-2103-0.
<mark>Original language</mark>English