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Analogue Fault Simulation Based on Layout-Dependent Fault Models.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Published

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Analogue Fault Simulation Based on Layout-Dependent Fault Models. / Harvey, Russell; Richardson, A. M. D.; Baker, K. et al.
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years. Washington, DC, USA: IEEE Computer Society, 1994. p. 641-649.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Harvard

Harvey, R, Richardson, AMD, Baker, K & Bruls, E 1994, Analogue Fault Simulation Based on Layout-Dependent Fault Models. in Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years. IEEE Computer Society, Washington, DC, USA, pp. 641-649. <http://portal.acm.org/citation.cfm?id=648016.743979&coll=GUIDE&dl=GUIDE&CFID=13872525&CFTOKEN=40293198>

APA

Harvey, R., Richardson, A. M. D., Baker, K., & Bruls, E. (1994). Analogue Fault Simulation Based on Layout-Dependent Fault Models. In Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years (pp. 641-649). IEEE Computer Society. http://portal.acm.org/citation.cfm?id=648016.743979&coll=GUIDE&dl=GUIDE&CFID=13872525&CFTOKEN=40293198

Vancouver

Harvey R, Richardson AMD, Baker K, Bruls E. Analogue Fault Simulation Based on Layout-Dependent Fault Models. In Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years. Washington, DC, USA: IEEE Computer Society. 1994. p. 641-649

Author

Harvey, Russell ; Richardson, A. M. D. ; Baker, K. et al. / Analogue Fault Simulation Based on Layout-Dependent Fault Models. Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years. Washington, DC, USA : IEEE Computer Society, 1994. pp. 641-649

Bibtex

@inbook{598fe08c195f438d95d587d99bd1e55c,
title = "Analogue Fault Simulation Based on Layout-Dependent Fault Models.",
author = "Russell Harvey and Richardson, {A. M. D.} and K. Baker and E. Bruls",
year = "1994",
language = "English",
isbn = "0-7803-2103-0.",
pages = "641--649",
booktitle = "Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years",
publisher = "IEEE Computer Society",

}

RIS

TY - CHAP

T1 - Analogue Fault Simulation Based on Layout-Dependent Fault Models.

AU - Harvey, Russell

AU - Richardson, A. M. D.

AU - Baker, K.

AU - Bruls, E.

PY - 1994

Y1 - 1994

M3 - Chapter

SN - 0-7803-2103-0.

SP - 641

EP - 649

BT - Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years

PB - IEEE Computer Society

CY - Washington, DC, USA

ER -