Application of colloid probe atomic force microscopy to the adhesion of thin films of viscous and viscoelastic silicone fluids

School of Engineering

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https://doi.org/10.1021/la202060f
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Keywords

Adhesives, Colloids, Dimethylpolysiloxanes, Elasticity, Light, Microscopy, Atomic Force, Models, Theoretical, Scattering, Radiation, Silicones, Solvents, Viscosity

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Application of colloid probe atomic force microscopy to the adhesion of thin films of viscous and viscoelastic silicone fluids. / Bowen, James; Cheneler, David; Andrews, James W. et al.
In: Langmuir, Vol. 27, No. 18, 20.09.2011, p. 11489-11500.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Bibtex

@article{ee4b009af6974ce788387b1cc7fe3f77,

title = "Application of colloid probe atomic force microscopy to the adhesion of thin films of viscous and viscoelastic silicone fluids",

abstract = "The adhesive characteristics of thin films (0.2-2 μm) of linear poly(dimethylsiloxane) (PDMS) liquids with a wide range of molecular weights have been measured using an atomic force microscope with a colloid probe (diameters 5 and 12 μm) for different separation velocities. The data were consistent with a residual film in the contact region having a thickness of ∼6 nm following an extended dwell time before separation of the probe. It was possible to estimate the maximum adhesive force as a function of the capillary number, Ca, by applying existing theoretical models based on capillary interactions and viscous flow except at large values of Ca in the case of viscoelastic fluids, for which it was necessary to develop a nonlinear viscoelastic model. The compliance of the atomic force microscope colloid beam was an important factor in governing the retraction velocity of the probe and therefore the value of the adhesive force, but the inertia of the beam and viscoelastic stress overshoot effects were not significant in the range of separation velocities investigated.",

keywords = "Adhesives, Colloids, Dimethylpolysiloxanes, Elasticity, Light, Microscopy, Atomic Force, Models, Theoretical, Scattering, Radiation, Silicones, Solvents, Viscosity",

author = "James Bowen and David Cheneler and Andrews, {James W.} and Avery, {Andrew R.} and Zhibing Zhang and Ward, {Michael C. L.} and Adams, {Michael J.}",

year = "2011",

month = sep,

day = "20",

doi = "10.1021/la202060f",

language = "English",

volume = "27",

pages = "11489--11500",

journal = "Langmuir",

issn = "0743-7463",

publisher = "AMER CHEMICAL SOC",

number = "18",

}

RIS

TY - JOUR

T1 - Application of colloid probe atomic force microscopy to the adhesion of thin films of viscous and viscoelastic silicone fluids

AU - Bowen, James

AU - Cheneler, David

AU - Andrews, James W.

AU - Avery, Andrew R.

AU - Zhang, Zhibing

AU - Ward, Michael C. L.

AU - Adams, Michael J.

PY - 2011/9/20

Y1 - 2011/9/20

N2 - The adhesive characteristics of thin films (0.2-2 μm) of linear poly(dimethylsiloxane) (PDMS) liquids with a wide range of molecular weights have been measured using an atomic force microscope with a colloid probe (diameters 5 and 12 μm) for different separation velocities. The data were consistent with a residual film in the contact region having a thickness of ∼6 nm following an extended dwell time before separation of the probe. It was possible to estimate the maximum adhesive force as a function of the capillary number, Ca, by applying existing theoretical models based on capillary interactions and viscous flow except at large values of Ca in the case of viscoelastic fluids, for which it was necessary to develop a nonlinear viscoelastic model. The compliance of the atomic force microscope colloid beam was an important factor in governing the retraction velocity of the probe and therefore the value of the adhesive force, but the inertia of the beam and viscoelastic stress overshoot effects were not significant in the range of separation velocities investigated.

AB - The adhesive characteristics of thin films (0.2-2 μm) of linear poly(dimethylsiloxane) (PDMS) liquids with a wide range of molecular weights have been measured using an atomic force microscope with a colloid probe (diameters 5 and 12 μm) for different separation velocities. The data were consistent with a residual film in the contact region having a thickness of ∼6 nm following an extended dwell time before separation of the probe. It was possible to estimate the maximum adhesive force as a function of the capillary number, Ca, by applying existing theoretical models based on capillary interactions and viscous flow except at large values of Ca in the case of viscoelastic fluids, for which it was necessary to develop a nonlinear viscoelastic model. The compliance of the atomic force microscope colloid beam was an important factor in governing the retraction velocity of the probe and therefore the value of the adhesive force, but the inertia of the beam and viscoelastic stress overshoot effects were not significant in the range of separation velocities investigated.

KW - Adhesives

KW - Colloids

KW - Dimethylpolysiloxanes

KW - Elasticity

KW - Light

KW - Microscopy, Atomic Force

KW - Models, Theoretical

KW - Scattering, Radiation

KW - Silicones

KW - Solvents

KW - Viscosity

U2 - 10.1021/la202060f

DO - 10.1021/la202060f

M3 - Journal article

C2 - 21842853

VL - 27

SP - 11489

EP - 11500

JO - Langmuir

JF - Langmuir

SN - 0743-7463

IS - 18

ER -

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