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Atomic force microscopy apparatus and a method thereof

Research output: Patent

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Atomic force microscopy apparatus and a method thereof. / Kolosov, Oleg (Inventor); Briggs, G. A. D. (Inventor).
Patent No.: WO 98/08046. Feb 26, 1998.

Research output: Patent

Harvard

Kolosov, O & Briggs, GAD Feb. 26 1998, Atomic force microscopy apparatus and a method thereof, Patent No. WO 98/08046.

APA

Kolosov, O., & Briggs, G. A. D. (1998). Atomic force microscopy apparatus and a method thereof. (Patent No. WO 98/08046).

Vancouver

Kolosov O, Briggs GAD, inventors. Atomic force microscopy apparatus and a method thereof. WO 98/08046. 1998 Feb 26.

Author

Kolosov, Oleg (Inventor) ; Briggs, G. A. D. (Inventor). / Atomic force microscopy apparatus and a method thereof. Patent No.: WO 98/08046. Feb 26, 1998.

Bibtex

@misc{4672a04a357c4a2cb6a4bf8efc60999b,
title = "Atomic force microscopy apparatus and a method thereof",
abstract = "The microscopy apparatus comprises a cantilever (10) having an atomically sharp tip (11) and a detector (15) which monitors the deflection of the tip (11) asa measure of the atomic force between the tip and a sample. A piezotransducer (12) is provided on the end of the cantilever (10) distant from the tip (11).The piezotransducer (12) generates high frequency vibrations which are applied to the cantilever. The vibrations transmitted to the tip (11) are modulated using means such as a second piezotransducer (20) in contact with the sample and the movement of the tip (II) is then sampled by the detector (15) at a much lower frequency. The microscopy apparatus and method described is able to maintain sensitivity to the properties of the sample whilst retaining sensitivity to the output of the apparatus. The apparatus and method is particularly suited of the study of time-dependent physico-chemical and physico-mechanical properties up to nanosecond and sub-nanosecond time resolution.",
keywords = "ultrasonic force microscopy, AFM, heterodyne, subsurface",
author = "Oleg Kolosov and Briggs, {G. A. D.}",
year = "1998",
month = feb,
day = "26",
language = "English",
type = "Patent",
note = "WO 98/08046; G01 B 7/34",

}

RIS

TY - PAT

T1 - Atomic force microscopy apparatus and a method thereof

AU - Kolosov, Oleg

AU - Briggs, G. A. D.

PY - 1998/2/26

Y1 - 1998/2/26

N2 - The microscopy apparatus comprises a cantilever (10) having an atomically sharp tip (11) and a detector (15) which monitors the deflection of the tip (11) asa measure of the atomic force between the tip and a sample. A piezotransducer (12) is provided on the end of the cantilever (10) distant from the tip (11).The piezotransducer (12) generates high frequency vibrations which are applied to the cantilever. The vibrations transmitted to the tip (11) are modulated using means such as a second piezotransducer (20) in contact with the sample and the movement of the tip (II) is then sampled by the detector (15) at a much lower frequency. The microscopy apparatus and method described is able to maintain sensitivity to the properties of the sample whilst retaining sensitivity to the output of the apparatus. The apparatus and method is particularly suited of the study of time-dependent physico-chemical and physico-mechanical properties up to nanosecond and sub-nanosecond time resolution.

AB - The microscopy apparatus comprises a cantilever (10) having an atomically sharp tip (11) and a detector (15) which monitors the deflection of the tip (11) asa measure of the atomic force between the tip and a sample. A piezotransducer (12) is provided on the end of the cantilever (10) distant from the tip (11).The piezotransducer (12) generates high frequency vibrations which are applied to the cantilever. The vibrations transmitted to the tip (11) are modulated using means such as a second piezotransducer (20) in contact with the sample and the movement of the tip (II) is then sampled by the detector (15) at a much lower frequency. The microscopy apparatus and method described is able to maintain sensitivity to the properties of the sample whilst retaining sensitivity to the output of the apparatus. The apparatus and method is particularly suited of the study of time-dependent physico-chemical and physico-mechanical properties up to nanosecond and sub-nanosecond time resolution.

KW - ultrasonic force microscopy

KW - AFM

KW - heterodyne

KW - subsurface

M3 - Patent

M1 - WO 98/08046

ER -