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Atomic-column scanning transmission electron microscopy analysis of misfit dislocations in GaSb/GaAs quantum dots

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Atomic-column scanning transmission electron microscopy analysis of misfit dislocations in GaSb/GaAs quantum dots. / Fernández-Delgado, N.; Herrera, M.; Chisholm, M. F. et al.
In: Journal of Materials Science, Vol. 51, No. 16, 08.2016, p. 7691-7698.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Harvard

Fernández-Delgado, N, Herrera, M, Chisholm, MF, Ahmad Kamarudin, M, Zhuang, Q, Hayne, M & Molina, SI 2016, 'Atomic-column scanning transmission electron microscopy analysis of misfit dislocations in GaSb/GaAs quantum dots', Journal of Materials Science, vol. 51, no. 16, pp. 7691-7698. https://doi.org/10.1007/s10853-016-0051-0

APA

Fernández-Delgado, N., Herrera, M., Chisholm, M. F., Ahmad Kamarudin, M., Zhuang, Q., Hayne, M., & Molina, S. I. (2016). Atomic-column scanning transmission electron microscopy analysis of misfit dislocations in GaSb/GaAs quantum dots. Journal of Materials Science, 51(16), 7691-7698. https://doi.org/10.1007/s10853-016-0051-0

Vancouver

Fernández-Delgado N, Herrera M, Chisholm MF, Ahmad Kamarudin M, Zhuang Q, Hayne M et al. Atomic-column scanning transmission electron microscopy analysis of misfit dislocations in GaSb/GaAs quantum dots. Journal of Materials Science. 2016 Aug;51(16):7691-7698. Epub 2016 May 17. doi: 10.1007/s10853-016-0051-0

Author

Fernández-Delgado, N. ; Herrera, M. ; Chisholm, M. F. et al. / Atomic-column scanning transmission electron microscopy analysis of misfit dislocations in GaSb/GaAs quantum dots. In: Journal of Materials Science. 2016 ; Vol. 51, No. 16. pp. 7691-7698.

Bibtex

@article{de643ea9ba3242a290d18b1ab5744a71,
title = "Atomic-column scanning transmission electron microscopy analysis of misfit dislocations in GaSb/GaAs quantum dots",
abstract = "The structural quality of GaSb/GaAs quantum dots (QDs) has been analyzed at atomic scale by aberration-corrected high-angle annular dark-field scanning transmission electron microscopy. In particular, we have studied the misfit dislocations that appear because of the high lattice mismatch in the heterostructure. Our results have shown the formation of Lomer dislocations at the interface between the GaSb QDs and the GaAs substrate, but also at the interface with the GaAs capping layer, which is not a frequent observation. The analysis of these dislocations point to the existence of chains of dislocation loops around the QDs. The dislocation core of the observed defects has been characterized, showing that they are reconstructed Lomer dislocations, which have less distortion at the dislocation core in comparison to unreconstructed ones. Strain measurements using geometric phase analysis (GPA) show that these dislocations may not fully relax the strain due to the lattice mismatch in the GaSb QDs.",
author = "N. Fern{\'a}ndez-Delgado and M. Herrera and Chisholm, {M. F.} and {Ahmad Kamarudin}, Mazliana and Qiandong Zhuang and Manus Hayne and Molina, {S. I.}",
year = "2016",
month = aug,
doi = "10.1007/s10853-016-0051-0",
language = "English",
volume = "51",
pages = "7691--7698",
journal = "Journal of Materials Science",
issn = "0022-2461",
publisher = "Springer Netherlands",
number = "16",

}

RIS

TY - JOUR

T1 - Atomic-column scanning transmission electron microscopy analysis of misfit dislocations in GaSb/GaAs quantum dots

AU - Fernández-Delgado, N.

AU - Herrera, M.

AU - Chisholm, M. F.

AU - Ahmad Kamarudin, Mazliana

AU - Zhuang, Qiandong

AU - Hayne, Manus

AU - Molina, S. I.

PY - 2016/8

Y1 - 2016/8

N2 - The structural quality of GaSb/GaAs quantum dots (QDs) has been analyzed at atomic scale by aberration-corrected high-angle annular dark-field scanning transmission electron microscopy. In particular, we have studied the misfit dislocations that appear because of the high lattice mismatch in the heterostructure. Our results have shown the formation of Lomer dislocations at the interface between the GaSb QDs and the GaAs substrate, but also at the interface with the GaAs capping layer, which is not a frequent observation. The analysis of these dislocations point to the existence of chains of dislocation loops around the QDs. The dislocation core of the observed defects has been characterized, showing that they are reconstructed Lomer dislocations, which have less distortion at the dislocation core in comparison to unreconstructed ones. Strain measurements using geometric phase analysis (GPA) show that these dislocations may not fully relax the strain due to the lattice mismatch in the GaSb QDs.

AB - The structural quality of GaSb/GaAs quantum dots (QDs) has been analyzed at atomic scale by aberration-corrected high-angle annular dark-field scanning transmission electron microscopy. In particular, we have studied the misfit dislocations that appear because of the high lattice mismatch in the heterostructure. Our results have shown the formation of Lomer dislocations at the interface between the GaSb QDs and the GaAs substrate, but also at the interface with the GaAs capping layer, which is not a frequent observation. The analysis of these dislocations point to the existence of chains of dislocation loops around the QDs. The dislocation core of the observed defects has been characterized, showing that they are reconstructed Lomer dislocations, which have less distortion at the dislocation core in comparison to unreconstructed ones. Strain measurements using geometric phase analysis (GPA) show that these dislocations may not fully relax the strain due to the lattice mismatch in the GaSb QDs.

U2 - 10.1007/s10853-016-0051-0

DO - 10.1007/s10853-016-0051-0

M3 - Journal article

VL - 51

SP - 7691

EP - 7698

JO - Journal of Materials Science

JF - Journal of Materials Science

SN - 0022-2461

IS - 16

ER -