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BIST and diagnostics for safety critical microsystems.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

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BIST and diagnostics for safety critical microsystems. / Olbrich, T.; Richardson, A. M. D.; Bradley, D. A.
Proceedings of an ESREF conference. Glasgow, 1994. p. 511-518.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Harvard

Olbrich, T, Richardson, AMD & Bradley, DA 1994, BIST and diagnostics for safety critical microsystems. in Proceedings of an ESREF conference. Glasgow, pp. 511-518.

APA

Olbrich, T., Richardson, A. M. D., & Bradley, D. A. (1994). BIST and diagnostics for safety critical microsystems. In Proceedings of an ESREF conference (pp. 511-518).

Vancouver

Olbrich T, Richardson AMD, Bradley DA. BIST and diagnostics for safety critical microsystems. In Proceedings of an ESREF conference. Glasgow. 1994. p. 511-518

Author

Olbrich, T. ; Richardson, A. M. D. ; Bradley, D. A. / BIST and diagnostics for safety critical microsystems. Proceedings of an ESREF conference. Glasgow, 1994. pp. 511-518

Bibtex

@inbook{8e14ceaee4364c8d9e8d45f3ab196c4a,
title = "BIST and diagnostics for safety critical microsystems.",
author = "T. Olbrich and Richardson, {A. M. D.} and Bradley, {D. A.}",
year = "1994",
language = "English",
pages = "511--518",
booktitle = "Proceedings of an ESREF conference",

}

RIS

TY - CHAP

T1 - BIST and diagnostics for safety critical microsystems.

AU - Olbrich, T.

AU - Richardson, A. M. D.

AU - Bradley, D. A.

PY - 1994

Y1 - 1994

M3 - Chapter

SP - 511

EP - 518

BT - Proceedings of an ESREF conference

CY - Glasgow

ER -