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Built-in self-test and diagnostic support for safety critical microsystems

Research output: Contribution to journalJournal article

Published

Journal publication date07/1996
JournalMicroelectronics Reliability
Journal number7-8
Volume36
Number of pages12
Pages1125-1136
Original languageEnglish

Abstract

Sensors and actuators with built-in local intelligence are often described as microsystems. The integration of processing electronics at the sensor and actuator level enables the distribution of processing tasks such as calibration and filtering as well as test and diagnostic functions from upper system hierarchies to lower levels. This paper describes Built-In-Self-Test (BIST) and diagnostic strategies for Safety Critical Microsystems. It compares different approaches and demonstrates the importance of utilising Reliability Indicators (Rls) for on-chip monitoring and diagnostics. The close relationship between Design for Testability (DfT) for post-production tests and the BIST strategies for on-line monitoring is outlined. A multichip design strategy is described for an example microsystem.