Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance - Research Portal | Lancaster University

Home > Research > Publications & Outputs > Built-In Self-Test in Intelligent Microsystems ...

School of Engineering

Associated organisational unit

Engineering of Microwaves, Terahertz and Light (E-MIT)

Links

http://www.tandfonline.com/doi/abs/10.1080/08982119608904671

Text available via DOI:

https://doi.org/10.1080/08982119608904671
Final published version

Keywords

Microsystems, Smart sensors , Self-test , Testability , Diagnosis , Quality

View graph of relations

Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Published

T. Olbrich
D. A. Bradley
A. M. D. Richardson

<mark>Journal publication date</mark>	1/06/1996
<mark>Journal</mark>	Quality Engineering
Issue number	4
Volume	8
Number of pages	13
Pages (from-to)	601-613
Publication Status	Published
<mark>Original language</mark>	English