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Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance. / Olbrich, T.; Bradley, D. A.; Richardson, A. M. D.
In: Quality Engineering, Vol. 8, No. 4, 01.06.1996, p. 601-613.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Olbrich, T, Bradley, DA & Richardson, AMD 1996, 'Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance', Quality Engineering, vol. 8, no. 4, pp. 601-613. https://doi.org/10.1080/08982119608904671

APA

Olbrich, T., Bradley, D. A., & Richardson, A. M. D. (1996). Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance. Quality Engineering, 8(4), 601-613. https://doi.org/10.1080/08982119608904671

Vancouver

Olbrich T, Bradley DA, Richardson AMD. Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance. Quality Engineering. 1996 Jun 1;8(4):601-613. doi: 10.1080/08982119608904671

Author

Olbrich, T. ; Bradley, D. A. ; Richardson, A. M. D. / Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance. In: Quality Engineering. 1996 ; Vol. 8, No. 4. pp. 601-613.

Bibtex

@article{464e56d06aa74e2ca6fc0e9f9cd7c5ab,
title = "Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance",
keywords = "Microsystems, Smart sensors , Self-test , Testability , Diagnosis , Quality",
author = "T. Olbrich and Bradley, {D. A.} and Richardson, {A. M. D.}",
year = "1996",
month = jun,
day = "1",
doi = "10.1080/08982119608904671",
language = "English",
volume = "8",
pages = "601--613",
journal = "Quality Engineering",
issn = "1532-4222",
publisher = "Taylor and Francis Ltd.",
number = "4",

}

RIS

TY - JOUR

T1 - Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance

AU - Olbrich, T.

AU - Bradley, D. A.

AU - Richardson, A. M. D.

PY - 1996/6/1

Y1 - 1996/6/1

KW - Microsystems

KW - Smart sensors

KW - Self-test

KW - Testability

KW - Diagnosis

KW - Quality

U2 - 10.1080/08982119608904671

DO - 10.1080/08982119608904671

M3 - Journal article

VL - 8

SP - 601

EP - 613

JO - Quality Engineering

JF - Quality Engineering

SN - 1532-4222

IS - 4

ER -