Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review
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TY - CONF
T1 - Comparison of Galvanometer and Polygon Scanning Systems on Component Production Rates in Selective Laser Sintering
AU - King, Beth
AU - Rennie, Allan Edward Watson
AU - Bennett, Graham R.
N1 - Conference code: 15
PY - 2017/4/27
Y1 - 2017/4/27
N2 - The selective laser sintering process utilises a galvanometer scanning system to execute vector scanning. By employing a polygon scanning system, it is possible to potentially reduce both scanning time and cost. This paper details research undertaken to mathematically characterise the time taken to execute vectors of the same length by both raster and vector scanning at a range of lengths. This is then used to calculate a fill factor to assess what percentage area in-fill is required for raster scanning to be more time efficient. Real data is subsequently used to calculate the fill factor for increasing values of power at different vector lengths. The inference of this paper is that raster scanning can be more efficient at a fill factor of 80.4% in an average case.
AB - The selective laser sintering process utilises a galvanometer scanning system to execute vector scanning. By employing a polygon scanning system, it is possible to potentially reduce both scanning time and cost. This paper details research undertaken to mathematically characterise the time taken to execute vectors of the same length by both raster and vector scanning at a range of lengths. This is then used to calculate a fill factor to assess what percentage area in-fill is required for raster scanning to be more time efficient. Real data is subsequently used to calculate the fill factor for increasing values of power at different vector lengths. The inference of this paper is that raster scanning can be more efficient at a fill factor of 80.4% in an average case.
KW - Selective Laser Sintering
KW - Raster Scanning
KW - Vector Scanning
M3 - Conference paper
T2 - Rapid Design, Prototyping & Manufacturing Conference
Y2 - 27 April 2017 through 28 April 2017
ER -