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Contactless graphene conductivity mapping on a wide range of substrates with terahertz time-domain reflection spectroscopy

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Article number10625
<mark>Journal publication date</mark>6/09/2017
<mark>Journal</mark>Scientific Reports
Issue number1
Volume7
Number of pages9
StatePublished
Original languageEnglish

Abstract

We demonstrate how terahertz time-domain spectroscopy (THz-TDS) operating in reflection geometry can be used for quantitative conductivity mapping of large area chemical vapour deposited graphene films on sapphire, silicon dioxide/silicon and germanium. We validate the technique against measurements performed with previously established conventional transmission based THz-TDS and are able to resolve conductivity changes in response to induced back-gate voltages. Compared to the transmission geometry, measurement in reflection mode requires careful alignment and complex analysis, but circumvents the need of a terahertz transparent substrate, potentially enabling fast, contactless, in-line characterisation of graphene films on non-insulating substrates such as germanium.