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Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

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Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs. / Olbrich, T.; Perez, J.; Grout, I. et al.
Proceedings of the international test conference 1996. Washington DC, 1996. p. 511-520.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Harvard

Olbrich, T, Perez, J, Grout, I, Richardson, A & Ferrer, C 1996, Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs. in Proceedings of the international test conference 1996. Washington DC, pp. 511-520.

APA

Olbrich, T., Perez, J., Grout, I., Richardson, A., & Ferrer, C. (1996). Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs. In Proceedings of the international test conference 1996 (pp. 511-520).

Vancouver

Olbrich T, Perez J, Grout I, Richardson A, Ferrer C. Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs. In Proceedings of the international test conference 1996. Washington DC. 1996. p. 511-520

Author

Olbrich, T. ; Perez, J. ; Grout, I. et al. / Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs. Proceedings of the international test conference 1996. Washington DC, 1996. pp. 511-520

Bibtex

@inbook{ec2d99f8f00b47baa9c4e55967efa623,
title = "Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs.",
author = "T. Olbrich and J. Perez and I. Grout and A. Richardson and C. Ferrer",
year = "1996",
language = "English",
isbn = "0780335406",
pages = "511--520",
booktitle = "Proceedings of the international test conference 1996",

}

RIS

TY - CHAP

T1 - Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs.

AU - Olbrich, T.

AU - Perez, J.

AU - Grout, I.

AU - Richardson, A.

AU - Ferrer, C.

PY - 1996

Y1 - 1996

M3 - Chapter

SN - 0780335406

SP - 511

EP - 520

BT - Proceedings of the international test conference 1996

CY - Washington DC

ER -