Research output: Contribution to Journal/Magazine › Journal article › peer-review
<mark>Journal publication date</mark> | 1996 |
---|---|
<mark>Journal</mark> | IEEE Design and Test of Computers |
Issue number | 2 |
Volume | 13 |
Number of pages | 8 |
Pages (from-to) | 10-17 |
Publication Status | Published |
<mark>Original language</mark> | English |
This switched-current memory cell with a built-in self-test option serves as a building block for a range of analog functions. As an example application, the authors present a divide-by-two circuit for reference signal generation in algorithmic A/D converters. They also describe two self-test approaches for these building blocks and evaluate their effectiveness. The self-test functions are easy to apply, require very little overhead, and result in fault coverage up to 95% for shorts and 60% for open circuits. Analysis reveals that 100% testability may not be achievable in a cost-effective way for mixed-signal circuits.