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Design Considerations for On-line Testing of a Capacitive Accelerometer.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

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Design Considerations for On-line Testing of a Capacitive Accelerometer. / Jeffery, C.; Bunyan, R. J. T.; Combes, D. et al.
Proceedings of the 11th IEEE International Mixed-Signals Testing Workshop. 2005. p. 220-223.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Harvard

Jeffery, C, Bunyan, RJT, Combes, D, King, DO & Richardson, AMD 2005, Design Considerations for On-line Testing of a Capacitive Accelerometer. in Proceedings of the 11th IEEE International Mixed-Signals Testing Workshop. pp. 220-223.

APA

Jeffery, C., Bunyan, R. J. T., Combes, D., King, D. O., & Richardson, A. M. D. (2005). Design Considerations for On-line Testing of a Capacitive Accelerometer. In Proceedings of the 11th IEEE International Mixed-Signals Testing Workshop (pp. 220-223)

Vancouver

Jeffery C, Bunyan RJT, Combes D, King DO, Richardson AMD. Design Considerations for On-line Testing of a Capacitive Accelerometer. In Proceedings of the 11th IEEE International Mixed-Signals Testing Workshop. 2005. p. 220-223

Author

Jeffery, C. ; Bunyan, R. J. T. ; Combes, D. et al. / Design Considerations for On-line Testing of a Capacitive Accelerometer. Proceedings of the 11th IEEE International Mixed-Signals Testing Workshop. 2005. pp. 220-223

Bibtex

@inbook{ef5150c89d4b4f3e9d93765556f2bdaf,
title = "Design Considerations for On-line Testing of a Capacitive Accelerometer.",
author = "C. Jeffery and Bunyan, {R. J. T.} and D. Combes and King, {D. O.} and Richardson, {Andrew M. D.}",
year = "2005",
language = "English",
pages = "220--223",
booktitle = "Proceedings of the 11th IEEE International Mixed-Signals Testing Workshop",

}

RIS

TY - CHAP

T1 - Design Considerations for On-line Testing of a Capacitive Accelerometer.

AU - Jeffery, C.

AU - Bunyan, R. J. T.

AU - Combes, D.

AU - King, D. O.

AU - Richardson, Andrew M. D.

PY - 2005

Y1 - 2005

M3 - Chapter

SP - 220

EP - 223

BT - Proceedings of the 11th IEEE International Mixed-Signals Testing Workshop

ER -