Home > Research > Publications & Outputs > Design Study of Corrugated Waveguide Slow-Wave ...

Research

Associated organisational units

Links

Text available via DOI:

View graph of relations

Design Study of Corrugated Waveguide Slow-Wave Structure for THz Amplification

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Published

Standard

Design Study of Corrugated Waveguide Slow-Wave Structure for THz Amplification. / Mineo, Mauro; Paoloni, Claudio.
2009 IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE. NEW YORK: IEEE, 2009. p. 104-105.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Harvard

Mineo, M & Paoloni, C 2009, Design Study of Corrugated Waveguide Slow-Wave Structure for THz Amplification. in 2009 IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE. IEEE, NEW YORK, pp. 104-105, 10th IEEE International Vacuum Electronics Conference, Rome, 28/04/09. https://doi.org/10.1109/IVELEC.2009.5193374

APA

Mineo, M., & Paoloni, C. (2009). Design Study of Corrugated Waveguide Slow-Wave Structure for THz Amplification. In 2009 IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE (pp. 104-105). IEEE. https://doi.org/10.1109/IVELEC.2009.5193374

Vancouver

Mineo M, Paoloni C. Design Study of Corrugated Waveguide Slow-Wave Structure for THz Amplification. In 2009 IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE. NEW YORK: IEEE. 2009. p. 104-105 doi: 10.1109/IVELEC.2009.5193374

Author

Mineo, Mauro ; Paoloni, Claudio. / Design Study of Corrugated Waveguide Slow-Wave Structure for THz Amplification. 2009 IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE. NEW YORK : IEEE, 2009. pp. 104-105

Bibtex

@inproceedings{5a13cc3476d54334bb1843110d6bef78,
title = "Design Study of Corrugated Waveguide Slow-Wave Structure for THz Amplification",
abstract = "THz Vacuum devices require high precision technological processes, but fabrication tolerances could highly affect the overall performances. Therefore a statistical analysis is fundamental for a reliable design. In this abstract, it is proposed a study on a Corrugated Waveguide Slow-Wave Structure for Traveling Wave Tubes in the THz region. An analytical model is validated by three dimensional electromagnetic softwares, both for cold and hot parameters. The proved accuracy and fast computation time make the model suitable for the sensitivity analysis of the structure.",
author = "Mauro Mineo and Claudio Paoloni",
year = "2009",
doi = "10.1109/IVELEC.2009.5193374",
language = "English",
isbn = "978-1-4244-3500-5",
pages = "104--105",
booktitle = "2009 IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE",
publisher = "IEEE",
note = "10th IEEE International Vacuum Electronics Conference ; Conference date: 28-04-2009 Through 30-04-2009",

}

RIS

TY - GEN

T1 - Design Study of Corrugated Waveguide Slow-Wave Structure for THz Amplification

AU - Mineo, Mauro

AU - Paoloni, Claudio

PY - 2009

Y1 - 2009

N2 - THz Vacuum devices require high precision technological processes, but fabrication tolerances could highly affect the overall performances. Therefore a statistical analysis is fundamental for a reliable design. In this abstract, it is proposed a study on a Corrugated Waveguide Slow-Wave Structure for Traveling Wave Tubes in the THz region. An analytical model is validated by three dimensional electromagnetic softwares, both for cold and hot parameters. The proved accuracy and fast computation time make the model suitable for the sensitivity analysis of the structure.

AB - THz Vacuum devices require high precision technological processes, but fabrication tolerances could highly affect the overall performances. Therefore a statistical analysis is fundamental for a reliable design. In this abstract, it is proposed a study on a Corrugated Waveguide Slow-Wave Structure for Traveling Wave Tubes in the THz region. An analytical model is validated by three dimensional electromagnetic softwares, both for cold and hot parameters. The proved accuracy and fast computation time make the model suitable for the sensitivity analysis of the structure.

U2 - 10.1109/IVELEC.2009.5193374

DO - 10.1109/IVELEC.2009.5193374

M3 - Conference contribution/Paper

SN - 978-1-4244-3500-5

SP - 104

EP - 105

BT - 2009 IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE

PB - IEEE

CY - NEW YORK

T2 - 10th IEEE International Vacuum Electronics Conference

Y2 - 28 April 2009 through 30 April 2009

ER -