Standard
Designing reliable digital molecular electronic circuits. /
Lei, Ci; Pamunuwa, Dinesh Bandara; Bailey, Stephen et al.
Nano-Net 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings. ed. / Alexandre Schmid; Sanjay Goel; Wei Wang; Valeriu Beiu; Sandro Carrara. Berlin: Springer, 2009. p. 111-115 (Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering).
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Harvard
Lei, C, Pamunuwa, DB, Bailey, S & Lambert, C 2009,
Designing reliable digital molecular electronic circuits. in A Schmid, S Goel, W Wang, V Beiu & S Carrara (eds),
Nano-Net 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings. Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, Springer, Berlin, pp. 111-115.
https://doi.org/10.1007/978-3-642-04850-0_17
APA
Lei, C., Pamunuwa, D. B., Bailey, S., & Lambert, C. (2009).
Designing reliable digital molecular electronic circuits. In A. Schmid, S. Goel, W. Wang, V. Beiu, & S. Carrara (Eds.),
Nano-Net 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings (pp. 111-115). (Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering). Springer.
https://doi.org/10.1007/978-3-642-04850-0_17
Vancouver
Lei C, Pamunuwa DB, Bailey S, Lambert C.
Designing reliable digital molecular electronic circuits. In Schmid A, Goel S, Wang W, Beiu V, Carrara S, editors, Nano-Net 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings. Berlin: Springer. 2009. p. 111-115. (Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering). doi: 10.1007/978-3-642-04850-0_17
Author
Lei, Ci ; Pamunuwa, Dinesh Bandara ; Bailey, Stephen et al. /
Designing reliable digital molecular electronic circuits. Nano-Net 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings. editor / Alexandre Schmid ; Sanjay Goel ; Wei Wang ; Valeriu Beiu ; Sandro Carrara. Berlin : Springer, 2009. pp. 111-115 (Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering).
Bibtex
@inproceedings{4f6dd68bd5ea4d008bf72e618db65960,
title = "Designing reliable digital molecular electronic circuits.",
abstract = "Reliability is expected to be a critical challenge in designing future molecular electronic circuits. Using a compact model that captures the essential physics of the device, the effect on digital gate functionality of variations in the device parameters, as well as the improvements afforded by a TMR majority gate structure are quantified. It is shown that the improvement is substantial, showing the potential viability of such technologies in future massively integrated systems.",
keywords = "molecular electronics , circuit simulation, nanotechnology",
author = "Ci Lei and Pamunuwa, {Dinesh Bandara} and Stephen Bailey and Colin Lambert",
year = "2009",
doi = "10.1007/978-3-642-04850-0_17",
language = "English",
isbn = "978-3-642-04849-4 ",
series = "Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering",
publisher = "Springer",
pages = "111--115",
editor = "Alexandre Schmid and Sanjay Goel and Wei Wang and Valeriu Beiu and Sandro Carrara",
booktitle = "Nano-Net 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings",
}
RIS
TY - GEN
T1 - Designing reliable digital molecular electronic circuits.
AU - Lei, Ci
AU - Pamunuwa, Dinesh Bandara
AU - Bailey, Stephen
AU - Lambert, Colin
PY - 2009
Y1 - 2009
N2 - Reliability is expected to be a critical challenge in designing future molecular electronic circuits. Using a compact model that captures the essential physics of the device, the effect on digital gate functionality of variations in the device parameters, as well as the improvements afforded by a TMR majority gate structure are quantified. It is shown that the improvement is substantial, showing the potential viability of such technologies in future massively integrated systems.
AB - Reliability is expected to be a critical challenge in designing future molecular electronic circuits. Using a compact model that captures the essential physics of the device, the effect on digital gate functionality of variations in the device parameters, as well as the improvements afforded by a TMR majority gate structure are quantified. It is shown that the improvement is substantial, showing the potential viability of such technologies in future massively integrated systems.
KW - molecular electronics
KW - circuit simulation
KW - nanotechnology
U2 - 10.1007/978-3-642-04850-0_17
DO - 10.1007/978-3-642-04850-0_17
M3 - Conference contribution/Paper
SN - 978-3-642-04849-4
T3 - Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering
SP - 111
EP - 115
BT - Nano-Net 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings
A2 - Schmid, Alexandre
A2 - Goel, Sanjay
A2 - Wang, Wei
A2 - Beiu, Valeriu
A2 - Carrara, Sandro
PB - Springer
CY - Berlin
ER -
