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Determination of surface recombination velocities of organic monolayers on silicon through Kelvin probe

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Determination of surface recombination velocities of organic monolayers on silicon through Kelvin probe. / Alderman, Nicholas; Ibrahim, Mohd Adib; Danos, Lefteris; Grossel, Martin ; Markvart, Tom.

In: Applied Physics Letters, Vol. 103, No. 8, 081603, 2013.

Research output: Contribution to journalJournal article

Harvard

Alderman, N, Ibrahim, MA, Danos, L, Grossel, M & Markvart, T 2013, 'Determination of surface recombination velocities of organic monolayers on silicon through Kelvin probe', Applied Physics Letters, vol. 103, no. 8, 081603. https://doi.org/10.1063/1.4818768

APA

Alderman, N., Ibrahim, M. A., Danos, L., Grossel, M., & Markvart, T. (2013). Determination of surface recombination velocities of organic monolayers on silicon through Kelvin probe. Applied Physics Letters, 103(8), [081603]. https://doi.org/10.1063/1.4818768

Vancouver

Author

Alderman, Nicholas ; Ibrahim, Mohd Adib ; Danos, Lefteris ; Grossel, Martin ; Markvart, Tom. / Determination of surface recombination velocities of organic monolayers on silicon through Kelvin probe. In: Applied Physics Letters. 2013 ; Vol. 103, No. 8.

Bibtex

@article{8d2eeb1071e944bdbd92cb788d479523,
title = "Determination of surface recombination velocities of organic monolayers on silicon through Kelvin probe",
abstract = "We report the determination of the surface recombination velocity of electron-hole pairs for silicon samples passivated with organic monolayers using the Kelvin probe. The recombination velocity was determined from the surface photovoltage and incident photon flux. By scanning of the Kelvin probe tip over the sample, the change in surface recombination velocity can be measured allowing recombination lifetime mapping. Organic monolayers with different chain lengths and exhibiting various recombination lifetimes were synthesized through a two-step chlorination-alkylation technique. The estimated recombination lifetimes were compared against those obtained from an industrial standard technique and were found to be in good agreement. ",
author = "Nicholas Alderman and Ibrahim, {Mohd Adib} and Lefteris Danos and Martin Grossel and Tom Markvart",
year = "2013",
doi = "10.1063/1.4818768",
language = "English",
volume = "103",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Inc.",
number = "8",

}

RIS

TY - JOUR

T1 - Determination of surface recombination velocities of organic monolayers on silicon through Kelvin probe

AU - Alderman, Nicholas

AU - Ibrahim, Mohd Adib

AU - Danos, Lefteris

AU - Grossel, Martin

AU - Markvart, Tom

PY - 2013

Y1 - 2013

N2 - We report the determination of the surface recombination velocity of electron-hole pairs for silicon samples passivated with organic monolayers using the Kelvin probe. The recombination velocity was determined from the surface photovoltage and incident photon flux. By scanning of the Kelvin probe tip over the sample, the change in surface recombination velocity can be measured allowing recombination lifetime mapping. Organic monolayers with different chain lengths and exhibiting various recombination lifetimes were synthesized through a two-step chlorination-alkylation technique. The estimated recombination lifetimes were compared against those obtained from an industrial standard technique and were found to be in good agreement.

AB - We report the determination of the surface recombination velocity of electron-hole pairs for silicon samples passivated with organic monolayers using the Kelvin probe. The recombination velocity was determined from the surface photovoltage and incident photon flux. By scanning of the Kelvin probe tip over the sample, the change in surface recombination velocity can be measured allowing recombination lifetime mapping. Organic monolayers with different chain lengths and exhibiting various recombination lifetimes were synthesized through a two-step chlorination-alkylation technique. The estimated recombination lifetimes were compared against those obtained from an industrial standard technique and were found to be in good agreement.

U2 - 10.1063/1.4818768

DO - 10.1063/1.4818768

M3 - Journal article

VL - 103

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 8

M1 - 081603

ER -