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Editorial: Mixed signal & analogue IC test technology

Research output: Contribution to Journal/Magazine › Editorial › peer-review

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Editorial: Mixed signal & analogue IC test technology. / Richardson, A ; Dorey, T .
In: IEE Proceedings - Circuits, Devices and Systems, Vol. 143, No. 6, 12.1996, p. 357-357.

Research output: Contribution to Journal/Magazine › Editorial › peer-review

Harvard

Richardson, A & Dorey, T 1996, 'Editorial: Mixed signal & analogue IC test technology', IEE Proceedings - Circuits, Devices and Systems, vol. 143, no. 6, pp. 357-357. https://doi.org/10.1049/ip-cds:19960955

APA

Richardson, A., & Dorey, T. (1996). Editorial: Mixed signal & analogue IC test technology. IEE Proceedings - Circuits, Devices and Systems, 143(6), 357-357. https://doi.org/10.1049/ip-cds:19960955

Vancouver

Richardson A, Dorey T. Editorial: Mixed signal & analogue IC test technology. IEE Proceedings - Circuits, Devices and Systems. 1996 Dec;143(6):357-357. doi: 10.1049/ip-cds:19960955

Author

Richardson, A ; Dorey, T . / Editorial: Mixed signal & analogue IC test technology. In: IEE Proceedings - Circuits, Devices and Systems. 1996 ; Vol. 143, No. 6. pp. 357-357.

Bibtex

@article{b4045faa64064f7483fe2887d9b67bee,
title = "Editorial: Mixed signal & analogue IC test technology",
author = "A Richardson and T Dorey",
year = "1996",
month = dec,
doi = "10.1049/ip-cds:19960955",
language = "English",
volume = "143",
pages = "357--357",
journal = "IEE Proceedings - Circuits, Devices and Systems",
issn = "1350-2409",
publisher = "Institute of Electrical Engineers",
number = "6",

}

RIS

TY - JOUR

T1 - Editorial: Mixed signal & analogue IC test technology

AU - Richardson, A

AU - Dorey, T

PY - 1996/12

Y1 - 1996/12

U2 - 10.1049/ip-cds:19960955

DO - 10.1049/ip-cds:19960955

M3 - Editorial

VL - 143

SP - 357

EP - 357

JO - IEE Proceedings - Circuits, Devices and Systems

JF - IEE Proceedings - Circuits, Devices and Systems

SN - 1350-2409

IS - 6

ER -