Fast prediction and optimization of yield in gallium arsenide large-signal MMICs

School of Engineering

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Fast prediction and optimization of yield in gallium arsenide large-signal MMICs. / D'Agostino, S ; Paoloni, C .
In: International Journal of RF and Microwave Computer-Aided Engineering, Vol. 8, No. 1, 01.1998, p. 68-76.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

D'Agostino, S & Paoloni, C 1998, 'Fast prediction and optimization of yield in gallium arsenide large-signal MMICs', International Journal of RF and Microwave Computer-Aided Engineering, vol. 8, no. 1, pp. 68-76. https://doi.org/10.1002/(SICI)1099-047X(199801)8:1<68::AID-MMCE10>3.0.CO;2-K

APA

D'Agostino, S., & Paoloni, C. (1998). Fast prediction and optimization of yield in gallium arsenide large-signal MMICs. International Journal of RF and Microwave Computer-Aided Engineering, 8(1), 68-76. https://doi.org/10.1002/(SICI)1099-047X(199801)8:1<68::AID-MMCE10>3.0.CO;2-K

Vancouver

D'Agostino S, Paoloni C. Fast prediction and optimization of yield in gallium arsenide large-signal MMICs. International Journal of RF and Microwave Computer-Aided Engineering. 1998 Jan;8(1):68-76. doi: 10.1002/(SICI)1099-047X(199801)8:1<68::AID-MMCE10>3.0.CO;2-K

Author

D'Agostino, S ; Paoloni, C . / Fast prediction and optimization of yield in gallium arsenide large-signal MMICs. In: International Journal of RF and Microwave Computer-Aided Engineering. 1998 ; Vol. 8, No. 1. pp. 68-76.

Bibtex

@article{fa117037c0cd46e4ac6a854a6e77653e,

title = "Fast prediction and optimization of yield in gallium arsenide large-signal MMICs",

abstract = "A study on the effects of the geometrical and physical parameters of the GaAs MMIC process on the yield of large-signal circuits is presented, Large-signal yield analysis as well as large-signal yield optimization are performed using a large-signal lumped-element MIESFET model related to MMIC process parameters, and suitable for implementation in commercial microwave CAD tools, The characterization of all the statistical variables of a large-signal circuit provides a better understanding of the yield behavior, In particular, the sensitivity of large-signal yield to MMIC process parameters is computed and the statistical behaviour of each parameter is presented by means of yield sensitivity histograms. (C) 1998 John Wiley & Sons, Inc.",

keywords = "yield, optimization , nonlinear circuits, MMIC",

author = "S D'Agostino and C Paoloni",

year = "1998",

month = jan,

doi = "10.1002/(SICI)1099-047X(199801)8:1<68::AID-MMCE10>3.0.CO;2-K",

language = "English",

volume = "8",

pages = "68--76",

journal = "International Journal of RF and Microwave Computer-Aided Engineering",

issn = "1096-4290",

publisher = "John Wiley and Sons Inc.",

number = "1",

}

RIS

TY - JOUR

T1 - Fast prediction and optimization of yield in gallium arsenide large-signal MMICs

AU - D'Agostino, S

AU - Paoloni, C

PY - 1998/1

Y1 - 1998/1

N2 - A study on the effects of the geometrical and physical parameters of the GaAs MMIC process on the yield of large-signal circuits is presented, Large-signal yield analysis as well as large-signal yield optimization are performed using a large-signal lumped-element MIESFET model related to MMIC process parameters, and suitable for implementation in commercial microwave CAD tools, The characterization of all the statistical variables of a large-signal circuit provides a better understanding of the yield behavior, In particular, the sensitivity of large-signal yield to MMIC process parameters is computed and the statistical behaviour of each parameter is presented by means of yield sensitivity histograms. (C) 1998 John Wiley & Sons, Inc.

AB - A study on the effects of the geometrical and physical parameters of the GaAs MMIC process on the yield of large-signal circuits is presented, Large-signal yield analysis as well as large-signal yield optimization are performed using a large-signal lumped-element MIESFET model related to MMIC process parameters, and suitable for implementation in commercial microwave CAD tools, The characterization of all the statistical variables of a large-signal circuit provides a better understanding of the yield behavior, In particular, the sensitivity of large-signal yield to MMIC process parameters is computed and the statistical behaviour of each parameter is presented by means of yield sensitivity histograms. (C) 1998 John Wiley & Sons, Inc.

KW - yield

KW - optimization

KW - nonlinear circuits

KW - MMIC

U2 - 10.1002/(SICI)1099-047X(199801)8:1<68::AID-MMCE10>3.0.CO;2-K

DO - 10.1002/(SICI)1099-047X(199801)8:1<68::AID-MMCE10>3.0.CO;2-K

M3 - Journal article

VL - 8

SP - 68

EP - 76

JO - International Journal of RF and Microwave Computer-Aided Engineering

JF - International Journal of RF and Microwave Computer-Aided Engineering

SN - 1096-4290

IS - 1

ER -

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